DLA - SMD-5962-96655 REV C
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, AND GATE, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 10 October 2003 |
| Status: | inactive |
| Page Count: | 26 |
Document History
July 10, 2019
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, AND GATE, MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
October 13, 2010
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, AND GATE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-96655 REV C
October 10, 2003
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, AND GATE, MONOLITHIC SILICON
A description is not available for this item.
August 8, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, AND GATE, MONOLITHIC SILICON
A description is not available for this item.
February 24, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, AND GATE, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
November 7, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, AND GATE, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...