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DLA - SMD-5962-92317

MICROCIRCUIT, DIGITAL, CMOS, OCTAL PI-BUS TRANSCEIVER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 30 December 1992
Status: inactive
Page Count: 24

Document History

SMD 5962-92317
February 5, 2021
MICROCIRCUIT, DIGITAL, Bi-CMOS, OCTAL PI-BUS TRANSCEIVER, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead...
SMD 5962-92317
May 7, 2014
MICROCIRCUIT, DIGITAL, Bi-CMOS, OCTAL PI-BUS TRANSCEIVER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-92317
April 12, 2010
MICROCIRCUIT, DIGITAL, Bi-CMOS, OCTAL PI-BUS TRANSCEIVER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-92317
April 23, 2009
MICROCIRCUIT, DIGITAL, CMOS, OCTAL PI-BUS TRANSCEIVER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-92317
December 21, 2000
MICROCIRCUIT, DIGITAL, CMOS, OCTAL PI-BUS TRANSCEIVER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Microcircuits covered by...
SMD 5962-92317
August 5, 1998
MICROCIRCUIT, DIGITAL, CMOS, OCTAL PI-BUS TRANSCEIVER, MONOLITHIC SILICON
DD Form 1695, APR 92 Previous editions are obsolete.
SMD-5962-92317 REV C
March 3, 1995
MICROCIRCUIT, DIGITAL, CMOS, OCTAL PI-BUS TRANSCEIVER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...
SMD-5962-92317 REV B
November 2, 1993
MICROCIRCUIT, DIGITAL, CMOS, OCTAL PI-BUS TRANSCEIVER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...
SMD-5962-92317 REV A
June 21, 1993
MICROCIRCUIT, DIGITAL, CMOS, OCTAL PI-BUS TRANSCEIVER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-92317
December 30, 1992
MICROCIRCUIT, DIGITAL, CMOS, OCTAL PI-BUS TRANSCEIVER, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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