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DLA - SMD-5962-88533

MICROCIRCUIT, DIGITAL, CMOS, ERROR DETECTION AND CORRECTION UNIT, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 2 June 1988
Status: inactive
Page Count: 23

Document History

SMD-5962-88533 REV C
April 20, 1994
MICROCIRCUIT, DIGITAL, CMOS, ERROR DETECTION AND CORRECTION UNIT, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
SMD-5962-88533 REV B
November 30, 1991
MICROCIRCUIT, DIGITAL, CMOS, ERROR DETECTION AND CORRECTION UNIT, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
SMD-5962-88533 REV A
June 30, 1989
MICROCIRCUIT, DIGITAL, CMOS, ERROR DETECTION AND CORRECTION UNIT, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-88533
June 2, 1988
MICROCIRCUIT, DIGITAL, CMOS, ERROR DETECTION AND CORRECTION UNIT, MONOLITHIC SILICON
A description is not available for this item.

References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-BUL-103AC CANC NOTICE 1 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by DLA on December 22, 1995
A description is not available for this item.
This document references:
MIL-M-38510 - MICROCIRCUITS, GENERAL SPECIFICATION FOR
Published by NPFC on August 27, 1993
A description is not available for this item.
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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