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DLA - SMD-5962-95630 REV B

MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 12 September 1997
Status: inactive
Page Count: 25
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN is as shown in the following example:

Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function 01 HS-1840RH Radiation hardened DI single 16-channel analog MUX/DEMUX with high impedance analog input overvoltage protection 02 HS-1840ARH Radiation hardened DI single 16-channel analog MUX/DEMUX with high impedance analog input overvoltage protection

The device class designator is a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535

The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X CDIP2-T28 28 Dual-in-line Y CDFP3-F28 28 Flat pack

The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M.

Supply voltage between V+ and V−.............................. +40 V Supply voltage between V+ and GND............................. +20 V Supply voltage between V− and GND............................. −20 V VREF to GND .................................................. +20 V Digital input overvoltage range .............................. ((GND) − 4 V) ≤ VA ≤ ((VREF) + 4 V) Analog input overvoltage range (power on/off): Device type 01 ............................................. −25 V ≤ VS ≤ +25 V Device type 02 ............................................. −35 V ≤ VS ≤ +35V Storage temperature range .................................... −65°C to +150°C Maximum package power dissipation (PD): 2/ Case X ..................................................... 1600 mW Case Y ..................................................... 1400 mW Lead temperature (soldering, 10 seconds) ..................... +275°C Thermal resistance, junction-to-case (ΘJC) ................... See MIL-STD-1835 Thermal resistance, junction-to-ambient (ΘJA): Case X ..................................................... 83.1°C/W Case Y ..................................................... 49.1°C/W

Positive supply voltage (V+) ...................................... +15V Negative supply voltage (V−) ...................................... −15V VREF .............................................................. 5 V dc VAH ............................................................... 4.0 V dc VAL ............................................................... 0.8 V dc VEN ............................................................... 0.8 V dc Ambient operating temperature range (TA) .......................... −55°C to +125°C Radiation features: 3/ SEP effective let no upsets: Device type 01 ................................................ 110 MeV/cm2/mg Device type 02 ................................................ 120 MeV/cm2/mg Total dose: Device type 01 ................................................ > 200 kRads (Si) Device type 02 ................................................ > 300 kRads (Si) Dose rate upset: Device type 01 ................................................ >1 × 108 Rad(Si)/s Device type 02 ................................................ Not tested Latch up ........................................................ None

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment) design applications, and logistics purposes.

Microcircuits... View More

Document History

October 21, 2019
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
Scope. This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar...
August 20, 2013
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
July 3, 2013
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
May 2, 2013
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
June 28, 2011
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
January 26, 2011
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
June 17, 2009
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
February 24, 2006
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
June 25, 2004
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
A description is not available for this item.
April 14, 2000
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
April 22, 1999
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
December 2, 1998
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
SMD-5962-95630 REV B
September 12, 1997
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
April 9, 1997
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
August 23, 1995
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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