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DLA - SMD-5962-95630

MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 23 August 1995
Status: inactive
Page Count: 21
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 HS-1840RH Radiation hardened DI single 16-channel analog MUX/DEMUX with high impedance analog input overvoltage protection.

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X CDIP2-T28 28 Dual-in-line Y CDFP3-F28 28 Flat pack

The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage between V+ and V− . . . . . . . . . . . 40 V dc Supply voltage between V+ and GND . . . . . . . . . . +20 V dc Supply voltage between V− and GND . . . . . . . . . . −20 V dc VREF to GND . . . . . . . . . . . . . . . . . . . . . +20 V dc Digital input overvoltage range . . . . . . . . . . . ((GND)−4 V) ≤ VA ≤ ((VREF)+4 V) Analog input overvoltage range (power on/off) . . . . −25 V ≤ VS ≤ +25 V Storage temperature range . . . . . . . . . . . . . . −65°C to +150°C Maximum package power dissipation (PD): 2/ Case X . . . . . . . . . . . . . . . . . . . . . . . 1600 mW Case Y . . . . . . . . . . . . . . . . . . . . . . . 1400 mW Lead temperature (soldering, 10 seconds) . . . . . . . 275°C Thermal resistance, junction-to-case (θJC) . . . . . . See MIL-STD-1835 Thermal resistance, junction-to-ambient (θJA): Case X . . . . . . . . . . . . . . . . . . . . . . . 83.1°C/W Case Y . . . . . . . . . . . . . . . . . . . . . . . 49.1°C/W

Positive supply voltage (V+) . . . . . . . . . . . . . . . . . . +15 V dc Negative supply voltage (V−) . . . . . . . . . . . . . . . . . . −15 V dc VREF . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 V dc VAH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.0 V dc VAL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.8 V dc VEN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.8 V dc Ambient operating temperature range (TA) . . . . . . . . . . . . −55°C to +125°C Radiation features: 3/ SEP effective let no upsets . . . . . . . . . . . . . . . . . 110 MeV/cm2/mg Total dose . . . . . . . . . . . . . . . . . . . . . . . . . . >200 kRad(SI) Dose rate upset . . . . . . . . . . . . . . . . . . . . . . . >1 × 108 Rad(SI)/s Latch-up . . . . . . . . . . . . . . . . . . . . . . . . . . . None

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

October 21, 2019
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
Scope. This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar...
August 20, 2013
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
July 3, 2013
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
May 2, 2013
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
June 28, 2011
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
January 26, 2011
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
June 17, 2009
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX / DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
February 24, 2006
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
June 25, 2004
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
A description is not available for this item.
April 14, 2000
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
April 22, 1999
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
December 2, 1998
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
September 12, 1997
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
April 9, 1997
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-95630
August 23, 1995
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED, SINGLE 16-CHANNEL ANALOG MUX/DEMUX WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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