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DLA - SMD-5962-91760

MICROCIRCUIT, MEMORY, DIGITAL, BICMOS, ONE TIME PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 19 January 1993
Status: inactive
Page Count: 22
scope:

This drawing forms a part of one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device Classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number 1/ circuit function Access time 01 22-input 10-output and-or-logic array 15 ns 02 22-input 10-output and-or-logic array 12 ns 03 22-input 10-output end-or-logic array 10 ns 04 22-input 10-output and-or-logic array 15 ns 05 22-input 10-output and-or-logic array 12 ns 06 22-input 10-output and-or-logic array 10 ns

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style 3 CQCCI-N28 28 Square leadless chip carrier

The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the Microcircuit or its packaging. The "X" designation for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range to ground potential (VCC) . . . . . . −0.5 V dc to +7.0 V dc DC voltage range applied to the outputs high-z state . . . −0.5 V dc to +VCC Maximum power dissipation . . . . . . . .. . . . . . . . . . 1.045 W 4/ Lead temperature (soldering, 10 seconds) . . . . . . . . . . +260°C Thermal resistance, function-to-case (θJC): Cases K, L, 3, and X . . . . . . . . . . . . . . . . . . . See MIL-STD-1835 Junction temperature (TJ) . . . . . . . . . . . . . . . . +175°C Storage temperature range (TST) . .. . . . . . . . . . −65°C to +150°C Temperature (under bias) range . . . . . . . . . . . . . . . −55°C to 125°C

Supply voltage range (VCC) . . . . . . . . . . . . . . . . . +4.5 V dc minimum to +5.5 V dc maximum Ground voltage (GND) . . . . . . . . . . . . . . . . . . . . 0 V dc Input high voltage (VIH) . . . . . . . . . . . . . . . . . 2.0 V dc minimum Input Low voltage (VIL) . . . . . . . . . . . . . . . . . 0.8 V dc maximum 5/ 5/ Case operating temperature range (TC) . . . . . . . . . . . −55°C to +125°C

Fault coverage measurement of manufacturing Logic tests (MIL-STD-883, test method 5012) . . . . . . . . xx percent 6/

intended Use:

Microcircuits conforming to this drawing are intended for use for government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

January 8, 2016
MICROCIRCUIT, MEMORY, DIGITAL, BICMOS, ONE TIME PROGRAMMABLE LOGIC DEVICE MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class M and Q), and nontraditional performance environment...
May 24, 2007
MICROCIRCUIT, MEMORY, DIGITAL, BICMOS, ONE TIME PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...
April 30, 1996
MICROCIRCUIT, MEMORY, DIGITAL, BICMOS, ONE TIME PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Three product assurance classes consisting of space application (device class V), military high...
December 15, 1995
MICROCIRCUIT, MEMORY, DIGITAL, BICMOS, ONE TIME PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Three product assurance classes consisting of space application (device class V), military high...
October 17, 1994
MICROCIRCUIT, MEMORY, DIGITAL, BICMOS, ONE TIME PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...
SMD-5962-91760
January 19, 1993
MICROCIRCUIT, MEMORY, DIGITAL, BICMOS, ONE TIME PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
This drawing forms a part of one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...
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