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NPFC - MIL-M-38510/757

MICROCIRCUITS, DIGITAL, ADVANCED CMOS, BUFFER GATES, MONOLITHIC SILICON, POSITIVE LOGIC

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Organization: NPFC
Publication Date: 1 February 2002
Status: inactive
Page Count: 4

Document History

MIL-M-38510/757C VALID NOTICE 4
August 29, 2023
Microcircuits, Digital, Advanced CMOS, Buffer Gates, Monolithic Silicon, Positive Logic
A description is not available for this item.
MIL-M-38510/757
October 23, 2018
Microcircuits, Digital, Advanced CMOS, Buffer Gates, Monolithic Silicon, Positive Logic
A description is not available for this item.
MIL-M-38510/757
January 10, 2014
Microcircuits, Digital, Advanced CMOS, Buffer Gates, Monolithic Silicon, Positive Logic
A description is not available for this item.
MIL-M-38510/757
April 2, 2009
Microcircuits, Digital, Advanced CMOS, Buffer Gates, Monolithic Silicon, Positive Logic
Scope. This specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and...
MIL-M-38510/757
November 14, 2003
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, BUFFER GATES, MONOLITHIC SILICON, POSITIVE LOGIC
Scope. This specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and...
MIL-M-38510/757
March 14, 2003
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, BUFFER GATES, MONOLITHIC SILICON, POSITIVE LOGIC
This specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation...
MIL-M-38510/757
February 1, 2002
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, BUFFER GATES, MONOLITHIC SILICON, POSITIVE LOGIC
A description is not available for this item.
MIL-M-38510/757
November 24, 1997
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, BUFFER GATES, MONOLITHIC SILICON, POSITIVE LOGIC
A description is not available for this item.
MIL-M-38510/757
August 9, 1996
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, BUFFER GATES, MONOLITHIC SILICON, POSITIVE LOGIC
A description is not available for this item.
MIL-M-38510/757
December 29, 1992
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, BUFFER GATES, MONOLITHIC SILICON, POSITIVE LOGIC
A description is not available for this item.
MIL-M-38510/757
June 29, 1992
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, BUFFER GATES, MONOLITHIC SILICON, POSITIVE LOGIC
This specification covers the detail requirements for monolithic silicon, advanced, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and...
MIL-M-38510/757
February 18, 1992
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, BUFFER GATES, MONOLITHIC SILICON, POSITIVE LOGIC
A description is not available for this item.
MIL-M-38510/757
December 28, 1989
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, BUFFER GATES, MONOLITHIC SILICON, POSITIVE LOGIC
A description is not available for this item.
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References

This document references:
JEDEC JESD 20 - Standard for Description of 54/74ACXXXXX and 54/74ACTXXXXX Advanced High-Speed CMOS Devices
Published by JEDEC on January 1, 1990
This standard describes electrical parameters for this class of CMOS devices.
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
JEDEC JESD 78 - IC Latch-Up Test
Published by JEDEC on April 1, 2016
This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits. The purpose of this standard is to establish a method for determining IC latch-up characteristics and...
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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