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DOD - SMD 5962-96891

MICROCIRCUIT, DIGITAL, MEMORY, DIGITAL, CMOS, RADIATION- HARDENED, 32K x 8-BIT PROM, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 24 March 2015
Status: active
Page Count: 20
scope:

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

September 29, 2022
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 32K x 8-BIT PROM, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead...
September 7, 2021
MICROCIRCUIT, DIGITAL, MEMORY, DIGITAL, CMOS, RADIATION- HARDENED, 32K x 8-BIT PROM, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-96891
March 24, 2015
MICROCIRCUIT, DIGITAL, MEMORY, DIGITAL, CMOS, RADIATION- HARDENED, 32K x 8-BIT PROM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
July 7, 2006
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 32K X 8-BIT PROM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
June 6, 2006
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 32K X 8-BIT PROM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
May 25, 2004
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 32K X 8-BIT PROM, MONOLITHIC SILICON
A description is not available for this item.
November 20, 1997
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 32K X 8-BIT PROM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
September 6, 1996
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 32K X 8-BIT PROM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...

References

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