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NPFC - MIL-STD-883

TEST METHOD STANDARD MICROCIRCUITS

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Organization: NPFC
Publication Date: 1 June 2015
Status: inactive
Page Count: 757
scope:

Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices. The test methods, controls, and procedures described herein have been prepared to serve several purposes:

a. To specify suitable conditions obtainable in the laboratory and at the device level which give test results equivalent to the actual service conditions existing in the field, and to obtain reproducibility of the results of tests. The tests described herein are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic or outer space location, since it is known that the only true test for operation in a specific application and location is an actual service test under the same conditions.

b. To describe in one standard all of the test methods of a similar character which now appear in the various joint-services and NASA microelectronic device specifications, so that these methods may be kept uniform and thus result in conservation of equipment, manhours, and testing facilities. In achieving this objective, it is necessary to make each of the general tests adaptable to a broad range of devices.

c. To provide for a level of uniformity of physical, electrical and environmental testing; manufacturing controls and workmanship; and materials to ensure consistent quality and reliability among all devices screened in accordance with this standard.

Document History

September 16, 2019
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
May 3, 2018
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
February 22, 2017
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
July 20, 2016
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
April 25, 2016
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
MIL-STD-883
June 1, 2015
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
June 20, 2014
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
March 14, 2014
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
March 14, 2014
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
November 7, 2013
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
February 26, 2010
TEST METHOD STANDARD MICROCIRCUITS
A description is not available for this item.
February 26, 2010
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
February 28, 2006
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
June 18, 2004
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
March 7, 2003
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
December 18, 2000
TEST METHOD STANDARD MICROCIRCUITS
This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental...
November 5, 1999
TEST METHOD STANDARD MICROCIRCUITS
This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental...
August 24, 1998
TEST METHOD STANDARD MICROCIRCUITS
When this document is referenced or used in conjunction with the processing and testing of JAN devices in conformance with the requirements of appendix A of MIL-PRF-38535, QML devices in conformance...
December 1, 1997
TEST METHOD STANDARD MICROCIRCUITS
A description is not available for this item.
December 31, 1996
TEST METHOD STANDARD MICROCIRCUITS
When this document is referenced or used in conjunction with the processing and testing of JAN devices in conformance with the requirements of appendix A of MIL-PRF-38535, QML devices in conformance...
October 31, 1995
TEST METHOD STANDARD MICROCIRCUITS
This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental...
March 14, 1995
TEST METHOD STANDARD MICROCIRCUITS
A description is not available for this item.
August 19, 1994
TEST METHOD STANDARD MICROCIRCUITS
When this document is referenced or used in conjunction with the processing and testing of JAN devices in conformance with the requirements of appendix A of MIL-I-38535, QML devices in conformance...
June 1, 1993
TEST METHOD STANDARD MICROCIRCUITS
A description is not available for this item.
November 15, 1991
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for designing, testing, identifying and certifying microelectronic devices suitable for use within Military and Aerospace...

References

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