NPFC - MIL-STD-883
TEST METHOD STANDARD MICROCIRCUITS
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| Organization: | NPFC |
| Publication Date: | 18 June 2004 |
| Status: | inactive |
| Page Count: | 708 |
scope:
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.
intended Use:
The intended use of this standard is to establish appropriate conditions for testing microcircuit devices to give test results that simulate the actual service conditions existing in the field.... View More
Document History
September 16, 2019
TEST METHOD STANDARD MICROCIRCUITS
Purpose.
This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
May 3, 2018
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
February 22, 2017
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
July 20, 2016
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
April 25, 2016
TEST METHOD STANDARD MICROCIRCUITS
Purpose.
This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
June 1, 2015
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
June 20, 2014
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
March 14, 2014
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
March 14, 2014
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
November 7, 2013
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
February 26, 2010
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
February 26, 2010
TEST METHOD STANDARD MICROCIRCUITS
A description is not available for this item.
February 28, 2006
TEST METHOD STANDARD MICROCIRCUITS
Purpose.
This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
MIL-STD-883
June 18, 2004
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
March 7, 2003
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
December 18, 2000
TEST METHOD STANDARD MICROCIRCUITS
This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental...
November 5, 1999
TEST METHOD STANDARD MICROCIRCUITS
This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental...
August 24, 1998
TEST METHOD STANDARD MICROCIRCUITS
When this document is referenced or used in conjunction with the processing and testing of JAN devices in conformance with the requirements of appendix A of MIL-PRF-38535, QML devices in conformance...
December 1, 1997
TEST METHOD STANDARD MICROCIRCUITS
A description is not available for this item.
December 31, 1996
TEST METHOD STANDARD MICROCIRCUITS
When this document is referenced or used in conjunction with the processing and testing of JAN devices in conformance with the requirements of appendix A of MIL-PRF-38535, QML devices in conformance...
October 31, 1995
TEST METHOD STANDARD MICROCIRCUITS
This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental...
March 14, 1995
TEST METHOD STANDARD MICROCIRCUITS
A description is not available for this item.
August 19, 1994
TEST METHOD STANDARD MICROCIRCUITS
When this document is referenced or used in conjunction with the processing and testing of JAN devices in conformance with the requirements of appendix A of MIL-I-38535, QML devices in conformance...
June 1, 1993
TEST METHOD STANDARD MICROCIRCUITS
A description is not available for this item.
November 15, 1991
TEST METHOD STANDARD MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for designing, testing, identifying and certifying microelectronic devices suitable for use within Military and Aerospace...
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