DOD - SMD 5962-89950
MICROCIRCUIT, DIGITAL, , ADVANCED CMOS, DUAL NEGATIVE EDGE TRIGGERED JK FLIPFLOP WITH ASYNCHRONOUS SET AND CLEAR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
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| Organization: | DOD |
| Publication Date: | 29 February 2016 |
| Status: | active |
| Page Count: | 21 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes M, Q, and B) and space application (device classes S and V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
June 24, 2022
MICROCIRCUIT, DIGITAL, , ADVANCED CMOS, DUAL NEGATIVE EDGE TRIGGERED JK FLIP-FLOP WITH ASYNCHRONOUS SET AND CLEAR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Replaceability....
SMD 5962-89950
February 29, 2016
MICROCIRCUIT, DIGITAL, , ADVANCED CMOS, DUAL NEGATIVE EDGE TRIGGERED JK FLIPFLOP WITH ASYNCHRONOUS SET AND CLEAR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, Q, and B) and space application (device classes S and V). A choice of case outlines and...
December 19, 2012
MICROCIRCUIT, DIGITAL, , ADVANCED CMOS, DUAL NEGATIVE EDGE TRIGGERED JK FLIPFLOP WITH ASYNCHRONOUS SET AND CLEAR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, Q, and B) and space application (device classes S and V). A choice of case outlines and...
July 19, 2006
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL NEGATIVE EDGE TRIGGERED JK FLIPFLOP WITH ASYNCHRONOUS SET AND CLEAR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, Q, and B) and space application (device classes S and V). A choice of case outlines and...
January 19, 1993
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL NEGATIVE EDGE TRIGGERED JK FLIPFLOP WITH ASYNCHRONOUS SET AND CLEAR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...