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This European Standard specifies terms and procedures for the characterization of mass spectrometer leak detectors (MSLD). It is not intended to give a complete set of specifications for an acceptance test but a description of procedures that can be used without particular...
This document specifies a method to optimize the mass calibration accuracy in time-of-flight secondary ion mass spectrometry (SIMS) instruments used for general analytical purposes. It is only applicable to time-of-flight instruments but is not restricted to any particular...
This document describes procedures to characterize quadrupole mass spectrometers (QMSs) with an ion source of electron impact ionization and which are designed for the measurement of atomic massto- charge ratios m/z < 300. This document is not applicable to QMSs with other ion...
4.1 This practice describes the essential components of a wavelength dispersive X-ray spectrometer. This description is presented so that the user may gain a general understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating...
4.1 This practice describes the essential components of a wavelength dispersive X-ray spectrometer. This description is presented so that the user or potential user may gain a cursory understanding of the structure of an X-ray spectrometer system. It also provides a means for...
1.1 This test method describes the determination of the isotope amount ratios of uranium material as nitrate solutions by the modified total evaporation (MTE) method using a thermal ionization mass spectrometer (TIMS) instrument. 1.2 The analytical performance in the determination of...
1.1 This test method describes the determination of the isotope amount ratios of uranium material as nitrate solutions by the modified total evaporation (MTE) method using a thermal ionization mass spectrometer (TIMS) instrument. 1.2 The analytical performance in the determination of...
1.1 This test method describes the determination of the isotope amount ratios of uranium material as nitrate solutions by the modified total evaporation (MTE) method using a thermal ionization mass spectrometer (TIMS) instrument. 1.2 The analytical performance in the determination of...
This International Standard specifies a secondary-ion mass spectrometric method using magnetic-sector or quadrupole mass spectrometers for depth profiling of boron in silicon, and using stylus profilometry or optical interferometry for depth scale calibration. This...
This International Standard specifies a secondary-ion mass spectrometric method using magnetic-sector or quadrupole mass spectrometers for depth profiling of arsenic in silicon, and using stylus profilometry or optical interferometry for depth calibration. This method is...
This International Standard defines terms relevant to quadrupole mass spectrometers (QMSs) and specifies the parameters required for specification by QMS manufacturers necessary for proper calibration and for maintaining the quality of partial pressure measurement. This...
4.1 Assessment of the spectrometer resolution and instrument line shape (ILS) function of a Raman spectrometer is important for intercomparability of spectra obtained among widely varying spectrometer systems, if spectra are to be transferred among systems, if various sampling...
This International Standard specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun...
