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JIS Z 8754 - Vacuum technology - Mass-spectrometer-type leak-detector calibration
February 20, 1999 - JSA
A description is not available for this item.
ISO 3530 - Vacuum Technology - Mass Spectrometer-Type Leak-Detector Calibration First Edition
January 1, 1979 - ISO
A description is not available for this item.
DS/EN 1518 - Non-destructive testing - Leak testing - Characterization of mass spectrometer leak detectors
November 30, 1998 - DS

This European Standard specifies terms and procedures for the characterization of mass spectrometer leak detectors (MSLD). It is not intended to give a complete set of specifications for an acceptance test but a description of procedures that can be used without particular...

ISO 13084 - Surface chemical analysis - Secondary ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
November 1, 2018 - ISO

This document specifies a method to optimize the mass calibration accuracy in time-of-flight secondary ion mass spectrometry (SIMS) instruments used for general analytical purposes. It is only applicable to time-of-flight instruments but is not restricted to any particular...

ISO TS 20175 - Vacuum technology - Vacuum gauges - Characterization of quadrupole mass spectrometers for partial pressure measurement
April 1, 2018 - ISO

This document describes procedures to characterize quadrupole mass spectrometers (QMSs) with an ion source of electron impact ionization and which are designed for the measurement of atomic massto- charge ratios m/z < 300. This document is not applicable to QMSs with other ion...

ISO 17560 - Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
September 15, 2014 - ISO

This International Standard specifies a secondary-ion mass spectrometric method using magnetic-sector or quadrupole mass spectrometers for depth profiling of boron in silicon, and using stylus profilometry or optical interferometry for depth scale calibration. This...

ISO 12406 - Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
November 15, 2010 - ISO

This International Standard specifies a secondary-ion mass spectrometric method using magnetic-sector or quadrupole mass spectrometers for depth profiling of arsenic in silicon, and using stylus profilometry or optical interferometry for depth calibration. This method is...

ISO 14291 - Vacuum gauges - Definitions and specifications for quadrupole mass spectrometers
July 15, 2012 - ISO

This International Standard defines terms relevant to quadrupole mass spectrometers (QMSs) and specifies the parameters required for specification by QMS manufacturers necessary for proper calibration and for maintaining the quality of partial pressure measurement. This...

DS/EN ISO 20486 - Non-destructive testing – Leak testing – Calibration of reference leaks for gases (ISO 20486:2017)
February 12, 2018 - DS

ISO 20486:2017 specifies the calibration of those leaks that are used for the adjustment of leak detectors for the determination of leakage rate in everyday use. One type of calibration method is a comparison with a reference leak. In this way, the leaks used for routine use become...

DIN EN ISO 20486 - Non-destructive testing - Leak testing - Calibration of reference leaks for gases (ISO 20486:2017)
May 1, 2018 - DIN

This document specifies the calibration of those leaks that are used for the adjustment of leak detectors for the determination of leakage rate in everyday use. One type of calibration method is a comparison with a reference leak. In this way, the leaks used for routine use become...

ISO 20486 - Non-destructive testing - Leak testing - Calibration of reference leaks for gases
December 1, 2017 - ISO

This document specifies the calibration of those leaks that are used for the adjustment of leak detectors for the determination of leakage rate in everyday use. One type of calibration method is a comparison with a reference leak. In this way, the leaks used for routine use become...

ISO 23830 - Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
November 15, 2008 - ISO

This International Standard specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun...

ASTM C1832 - Standard Test Method for Determination of Uranium Isotopic Composition by the Modified Total Evaporation (MTE) Method Using a Thermal Ionization Mass Spectrometer
January 15, 2016 - ASTM

This test method describes the determination of the isotope amount ratios of uranium material as nitrate solutions by the modified total evaporation (MTE) method using a thermal ionization mass spectrometer (TIMS) instrument. The analytical performance in the determination of...

A-A-59165 - DETECTOR, LEAK, HELIUM MASS SPECTROMETER
NPFC
A description is not available for this item.
ASTM E2529 - Standard Guide for Testing the Resolution of a Raman Spectrometer
December 1, 2006 - ASTM

This guide is designed for routine testing and assessment of the spectral resolution of Raman spectrometers using either a low-pressure arc lamp emission lines or a calibrated Raman band of calcite. The values stated in SI units are to be regarded as standard. No other units of measurement...

ISO 21501-1 - Determination of particle size distribution - Single particle light interaction methods - Part 1: Light scattering aerosol spectrometer
June 1, 2009 - ISO

This part of ISO 21501 specifies characteristics of a light scattering aerosol spectrometer (LSAS) which is used for measuring the size, number concentration and number/size distribution of particles suspended in a gas. The light scattering technique described in this part of ISO 21501 is...

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