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This SAE Aerospace Recommended Practice (ARP) contains methods used to measure the optical performance of airborne electronic flat panel display (FPD) systems. The methods described are specific to the direct view, liquid crystal matrix (x-y addressable) display technology used...
4.1 Sputter crater depth measurements are performed in order to determine a sputter rate (depth/time) for each matrix sputtered during a sputter depth profile or similar in-depth type analyses. From sputter rate values, a linear depth scale can be calculated and displayed for the...
Learn how you can control LEDs, make music, and read sensor data using popular microcontrollers such as Adafruit Circuit Playground, ESP8266, and the BBC micro:bit Key Features * Load and execute your first program with MicroPython * Program an IoT device to retrieve weather data using a RESTful...
Abstract: 10 brand new DIY projects for your Raspberry Pi! This fully illustrated TAB guide shows how to construct and program all kinds of fun and innovative gadgets with your Raspberry Pi. Raspberry Pi® Electronics Projects for the Evil Genius" features 10 complete projects that showcase cool...
Sputter crater depth measurements are performed in order to determine a sputter rate (depth/time) for each matrix sputtered during a sputter depth profile or similar in-depth type analyses. From sputter rate values, a linear depth scale can be calculated and displayed for the sputter...
This SAE Aerospace Recommended Practice (ARP) contains methods used to measure the optical performance of airborne electronic flat panel display (FPD) systems. The methods described are specific to the direct view, liquid crystal matrix (x-y addressable) display technology used...
Sputter crater depth measurements are performed in order to determine a sputter rate (depth/time) for each matrix sputtered during a sputter depth profile or similar in-depth type analyses. From sputter rate values, a linear depth scale can be calculated and displayed for the sputter...
This part of IEC 61947 specifies requirements for measuring and documenting key performance parameters for CRT and laser-based projectors and other variable resolution projectors that are capable of multiple variable resolutions and in which the image is rasterscanned. The provisions of this...
This is a single-source treatment of developments in TFT production from international specialists. It interweaves overlapping areas in multiple disciplines pertinent to transistor fabrication and explores the killer application of amorphous silicon transistors in active matrix liquid...
This part of IEC 61947 specifies requirements for measuring and documenting key performance parameters for CRT and laser-based projectors and other variable resolution projectors that are capable of multiple variable resolutions and in which the image is raster-scanned. The provisions of this...
This part of IEC 61947 specifies requirements for measuring and documenting key performance parameters for electronic projection systems with fixed resolution projectors in which the light source and projection/magnifica
This SAE Aerospace Recommended Practice (ARP) contains methods used to measure the optical performance of airborne flat panel display (FPD) systems. The methods described are specific to the direct view, liquid crystal matrix (x-y addressable) display technology used on...