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1.1 This test method covers the measurement of metallic coating thicknesses by examination of a cross section with a scanning electron microsope (SEM). This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user...
This document defines the most important quantities that characterize an energy-dispersive X‑ray spectrometer consisting of a semiconductor detector, a pre-amplifier and a signal-processing unit as the essential parts. This document is only applicable to spectrometers with semiconductor detectors...
1.1 The test method covers the measurement of metallic coating thicknesses by examination of a cross section with a scanning electron microsope (SEM). 1.2 This standard may involve hazardous materials, operations, and equipment. This standard does not purport to address all of the safety...
This test method covers the measurement of metallic coating thicknesses by examination of a cross section with a scanning electron microsope (SEM). The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. This standard does...
4.1 The purpose of this test method is to define a procedure for testing components being considered for installation into a high-purity gas distribution system. Application of this test method is expected to yield comparable data among components tested for purposes of qualification for this...
4.1 The purpose of this test method is to define a procedure for testing components being considered for installation into a high-purity gas distribution system. Application of this test method is expected to yield comparable data among components tested for purposes of qualification for this...
The purpose of this test method is to define a procedure for testing components being considered for installation into a high-purity gas distribution system. Application of this test method is expected to yield comparable data among components tested for purposes of qualification for this...
1.1 This test method covers the testing of interior surfaces of components such as tubing, fittings, and valves for surface morphology. 1.2 This test method applies to all surfaces of tubing, connectors, regulators, valves, and any metal component, regardless of size. 1.3 Limitations: 1.3.1 This...
This test method covers the testing of interior surfaces of components such as tubing, fittings, and valves for surface morphology. This test method applies to all surfaces of tubing, connectors, regulators, valves, and any metal component, regardless of size. Limitations: This methodology assumes...
Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.
Recommends methods for measuring particles in the range 2 nm to 1 mm using light, scanning electron and transmission electron microscopes. Calculation examples are included.
Purpose. This test procedure describes two (2) methods for determining the coating thickness on sponge and dense weatherstrips: • Method A: Optical microscope technique. • Method B: Scanning electron microscope technique.
Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the...
This Technical Specification specifies methods of evaluating the sharpness of digitized images generated by a scanning electron microscope (SEM) by means of a Fourier transform (FT) method, a contrast-to-gradient
