Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
|Publication Date:||1 April 2017|
|ICS Code (Semiconductor devices in general):||31.080.01|
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This test method is considered destructive.