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SNV - SN EN IEC 61967-1

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions

active, Most Current
Organization: SNV
Publication Date: 1 February 2019
Status: active
Page Count: 5
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

SN EN IEC 61967-1
February 1, 2019
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
A description is not available for this item.

References

This document references:
IEC 61967-2 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method
Published by IEC on September 1, 2005
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is...
This document references:
IEC 61967-4 - Integrated circuits – Measurement of electromagnetic emissions – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
Published by IEC on March 1, 2021
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
This document references:
IEC 61967-5 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 5: Measurement of conducted emissions Workbench Faraday Cage method
Published by IEC on February 1, 2003
This part of IEC 61967 describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on the standardised test-board or on a final printed circuit board...
This document references:
IEC 61967-6 - Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
Published by IEC on June 1, 2008
This part of the IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This...
This document references:
61967-8 - Integrated circuits – Measurement of electromagnetic emissions – Part 8: Measurement of radiated emissions – IC stripline method
Published by IEC on May 1, 2023
This part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test...
This document references:
IEC 62132-1 - Integrated circuits – Measurement of electromagnetic immunity – Part 1: General conditions and definitions
Published by IEC on October 1, 2015
This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines...
This document references:
IEC CISPR 16-1-1 - Specification for radio disturbance and immunity measuring apparatus and methods – Part 1-1: Radio disturbance and immunity measuring apparatus – Measuring apparatus
Published by IEC on May 1, 2019
This part of CISPR 16 specifies the characteristics and performance of equipment for the measurement of radio disturbance in the frequency range 9 kHz to 18 GHz. In addition, requirements are...
This document references:
IEC CISPR 25 - Vehicles, boats and internal combustion engines – Radio disturbance characteristics – Limits and methods of measurement for the protection of on-board receivers
Published by IEC on October 1, 2016
This International Standard contains limits and procedures for the measurement of radio disturbances in the frequency range of 150 kHz to 2 500 MHz. The standard applies to any electronic/electrical...
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