DS/ISO/IEC 10373-6/AMD 3
PICC loading effect
| Organization: | DS |
| Publication Date: | 3 April 2018 |
| Status: | inactive |
| Page Count: | 10 |
| ICS Code (Identification cards. Chip cards. Biometrics): | 35.240.15 |
scope:
ISO/IEC 10373 defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross-referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications. NOTE 1 - Criteria for acceptability do not form part of ISO/IEC 10373, but will be found in the International Standards mentioned above. NOTE 2 - Test methods defined in this part of ISO/IEC 10373 are intended to be performed separately. A given proximity card or object, or proximity coupling device, is not required to pass through all the tests sequentially. This part of ISO/IEC 10373 defines test methods which are specific to proximity cards and objects, and proximity coupling devices, defined in ISO/IEC 14443-1:2008, ISO/IEC 14443-2:2010, ISO/IEC 14443-3:2010 and ISO/IEC 14443-4:2008. ISO/IEC 10373-1 defines test methods which are common to one or more integrated circuit card technologies and other parts deal with other technology-specific tests.
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