DIN - VDI/VDE 2655 BLATT 1.1

Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement

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Organization: DIN
Publication Date: 1 March 2008
Status: active
Page Count: 39
ICS Code (Optical equipment): 37.020
ICS Code (DINGCD22): DINGCD22
ICS Code (Optics and optical measurements in general): 17.180.01

Document History

March 1, 2018
Optical measurement of microtopography - Calibration of interference microscopes for form measurement
A description is not available for this item.
October 1, 2010
Optical measurement of microtopography - Calibration of confocal microscopes and depth setting standards for roughness measurement
A description is not available for this item.
September 1, 2009
Optical measurement of microtopography - Calibration of confocal microscopes and depth setting standards for roughness measurements
A description is not available for this item.
VDI/VDE 2655 BLATT 1.1
March 1, 2008
Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
A description is not available for this item.
April 1, 2005
Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
A description is not available for this item.

References

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