scope:

Structures are defined in STIL to support usage as semiconductor simulation stimulus, including (1) mapping signal names to equivalent design references, (2) interface between scan and built-in self test (BIST) and the logic simulation, (3) data types to represent unresolved states in a pattern, (4) parallel or asynchronous pattern execution on different design blocks, and (5) expression-based conditional execution of pattern constructs.

Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design⁴ (i.e., embedded cores) such that these tests can be incorporated into a complete higher level device test.

Structures are defined in STIL to relate fail information from device testing environments back to original stimulus and design data elements.

Purpose

The STIL language definition is enhanced to support the usage of STIL in the design environment, which includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments.

In addition, define extensions to support the definition of subelement tests and to define the mechanisms to integrate those tests into a complete device test. This effort is to be performed in conjunction with IEEE Std 1500^TM-2005 [B6] and IEEE P1450.6 [B5], which are defining standards for the definition and integration of embedded cores.

Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.

⁴Syntax in this document that is used in the definition of patterns for sub-blocks is summarized in Annex O.