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DLA - SMD-5962-95627

MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 9 November 1995
Status: inactive
Page Count: 22

Document History

December 14, 2017
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device...
April 5, 2011
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability, (device classes M and Q), and nontraditional performance environment...
April 4, 2005
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability, (device classes M and Q), and nontraditional performance environment...
November 18, 1997
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
A description is not available for this item.
June 23, 1997
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...
February 14, 1996
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Three product assurance classes consisting of space application (device class V), military high...
SMD-5962-95627
November 9, 1995
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
A description is not available for this item.

References

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