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DLA - DSCC-DWG-V62/14616

MICROCIRCUIT, LINEAR, VAUX POWER DISTRIBUTION SWITCH , MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 9 July 2014
Status: inactive
Page Count: 10
scope:

This drawing documents the general requirements of a high performance VAUX power distribution switch microcircuit, with an operating temperature range of -55°C to +125°C.

Document History

DSCC-DWG-V62/14616 REV A
May 13, 2021
MICROCIRCUIT, LINEAR, VAUX POWER DISTRIBUTION SWITCH, MONOLITHIC SILICON
Scope. This drawing documents the general requirements of a high performance VAUX power distribution switch microcircuit, with an operating temperature range of -55°C to +125°C.
DSCC-DWG-V62/14616
July 9, 2014
MICROCIRCUIT, LINEAR, VAUX POWER DISTRIBUTION SWITCH , MONOLITHIC SILICON
This drawing documents the general requirements of a high performance VAUX power distribution switch microcircuit, with an operating temperature range of -55°C to +125°C.

References

This document references:
ASTM G30 - Standard Practice for Making and Using U-Bend Stress-Corrosion Test Specimens
Published by ASTM on April 10, 1997
This practice covers procedures for making and using U-bend specimens for the evaluation of stress-corrosion cracking in metals. The U-bend specimen is generally a rectangular strip which is bent...
This document references:
ESDA/JEDEC JS-001 - Electrostatic Discharge Sensitivity Testing Human Body Model (HBM) - Component Level
Published by ESD on December 8, 2016
This standard establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a...
This document references:
JEDEC JEP 155 - Recommended ESD Target Level for HBM Qualification
Published by JEDEC on July 1, 2018
The intent of this report is to document and provide critical information to assess and make decisions on safe ESD level requirements. The scope of this document is to provide this information to...
This document references:
JEP157A - Recommended ESD-CDM Target Levels
Published by JEDEC on April 1, 2022
The intent of this report is to document and provide critical information to assess and make decisions on safe CDM ESD level requirements. The scope of this document is to provide this information to...
This document references:
JEP95 BOOK 1 - Book One Registered and Standard Outlines for Solid State and Related Products
Published by JEDEC on March 1, 1997
PREFACE This Publication contains those solid state product outlines and other associated drawings that have been registered and assigned a JEDEC designation and are printed on white paper. Product...
This document references:
JEDEC JESD 51 - Methodology for the Thermal Measurement of Component Packages (Single Semiconductor Device)
Published by JEDEC on December 1, 1995
This standard and its subsequent addendum's, provides a standard for thermal measurement that, if followed fully, will provide correct and meaningful data that will allow for determination of...
This document references:
JEDEC JESD 51-2 - Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
Published by JEDEC on January 1, 2008
This document outlines the environmental conditions necessary to ensure accuracy and repeatability for a standard junction-to-ambient thermal resistance measurement in natural convection.
This document references:
JEDEC JESD 51-7 - High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
Published by JEDEC on February 1, 1999
This fixturing further defines the environment for thermal test of packaged microelectronic devices. Its function is to provide an alternate mounting surface for the analysis of heat flow in...
This document references:
JEDEC JESD 51-8 - Integrated Circuit Thermal Test Method Environmental Conditions - Junction-to-Board
Published by JEDEC on October 1, 1999
This specification should be used in conjunction with the overview document JESD51, Methodology for the Thermal Measurement of Component Packages (Single Semiconductor Device) [1] and the electrical...
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