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DOD - SMD 5962-95627

MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 14 December 2017
Status: active
Page Count: 23
scope:

This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. For device class N, the user is cautioned to assure that the device is appropriate for the application environment.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD 5962-95627
December 14, 2017
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device...
April 5, 2011
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability, (device classes M and Q), and nontraditional performance environment...
April 4, 2005
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability, (device classes M and Q), and nontraditional performance environment...
November 18, 1997
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
A description is not available for this item.
June 23, 1997
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...
February 14, 1996
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Three product assurance classes consisting of space application (device class V), military high...
November 9, 1995
MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 18 CLOCKED FIFO, MONOLITHIC SILICON
A description is not available for this item.

References

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