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CEI EN 62132-1

Integrated circuits - Measurement of electromagnetic immunity Part 1: General conditions and definitions

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Organization: CEI
Publication Date: 1 October 2016
Status: active
Page Count: 34
ICS Code (Integrated circuits. Microelectronics): 31.200
scope:

This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s).

Document History

CEI EN 62132-1
October 1, 2016
Integrated circuits - Measurement of electromagnetic immunity Part 1: General conditions and definitions
This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines...
August 1, 2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
La presente è la Norma base della serie 62132 e riguarda gli aspetti dell'immunità elettromagnetica relativa ai circuiti integrati. In particolare essa fornisce informazioni generali e definizioni...

References

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