NPFC - MIL-STD-883
TEST METHOD STANDARD MICROCIRCUITS
|Publication Date:||16 September 2019|
This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices. The test methods, controls, and procedures described herein have been prepared to serve several purposes:
a. To specify suitable conditions obtainable in the laboratory and at the device level which give test results equivalent to the actual service conditions existing in the field, and to obtain reproducibility of the results of tests. The tests described herein are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic or outer space location, since it is known that the only true test for operation in a specific application and location is an actual service test under the same conditions.
b. To describe in one standard all of the test methods of a similar character which now appear in the various joint-services and NASA microelectronic device specifications, so that these methods may be kept uniform and thus result in conservation of equipment, manhours, and testing facilities. In achieving this objective, it is necessary to make each of the general tests adaptable to a broad range of devices.
c. To provide for a level of uniformity of physical, electrical and environmental testing; manufacturing controls and workmanship; and materials to ensure consistent quality and reliability among all devices screened in accordance with this standard.
Intended use of or reference to MIL-STD-883.
When this document is referenced or used in conjunction with the processing and testing of JAN devices in conformance with the requirements of appendix A of MIL-PRF-38535, QML devices in conformance with MIL-PRF-38535 or non-JAN devices in accordance with 1.2.1 or 1.2.2 herein, such processing and testing is required to be in full conformance with all the applicable general requirements and those of the specifically referenced test methods and procedures.
For contracts negotiated prior to 31 December 1984, device types that have been classified as manufacturer's 883 (B or S) product prior to 31 December 1984 are not required to meet 1.2.1 or 1.2.2.
Existing contracts as of the 31 December 1984, previously negotiated add-ons to these contracts, and future spares for these contracts may continue to use device types which were classified as manufacturer's 883 (B or S) prior to 31 December 1984.
New contracts, and any device types classified as compliant to MIL-STD-883 after 31 December 1984 are required to comply with 1.2.1. Any devices meeting only the provisions of 1.2.2 are noncompliant to MIL-STD-883.
Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices.
When any manufacturer, contractor, subcontractor, or original equipment manufacturer requires or claims a non-JAN part compliant with MIL-STD-883, all provisions of Appendix A of MIL-PRF-38535 are required to be met. In addition, manufacturers that have produced or are producing products in accordance with 1.2.1a are subject to a Government compliance validation audit on a drop-in basis with a minimum of notice. Such processing and testing are required to be in compliance with all of the applicable general controls and requirements defined herein and those of the specifically referenced test methods and procedures with no reinterpretations, deviations or omissions except as specifically allowed in the device specification or standard microcircuit drawing covering the same generic device. Deviations specifically granted in the device specification or standard microcircuit drawing may also be applied to devices manufactured in the same process, to the same design criteria, and using elements of the same microcircuit group as those used for devices covered by the device specification or standard microcircuit drawing. Such reference include the following:
Manufacturers who use MIL-STD-883 in device marking, or make statements in applicable certificates of conformance that parts are compliant with MIL-STD-883, or make statements in advertisements or in published brochures or other marketing documents that parts provided are compliant with MIL-STD-883.
Contractors, sub-contractors, or original equipment manufacturers who prepare vendor item drawings, (previously called Specification Control drawings), or Selected Item drawings which require compliance with MIL-STD-883, or invoke it in its entirety as the applicable standard (see 1.2.2 for noncompliant devices).
a. Custom monolithic, non-JAN multichip and all other non-JAN microcircuits except non-JAN hybrids described or implied to be compliant with methods 5004 and 5005 or 5010 of MIL-STD-883 are required to meet all of the non-JAN requirements of Appendix A of MIL-PRF-38535.
b. Hybrid microcircuits described as compliant or multichip microcircuits described as compliant to MIL-PRF- 38534 are required to meet all the requirements of MIL-PRF-38534 (or equivalent procedures/ requirements of reciprocal listing provisions for product of other nations based on existing international agreements):
Provisions for the use of MIL-STD-883 in conjunction with non-compliant non -JAN devices.
Any device that is processed with deviations and which is not processed in compliance with the provisions of 1.2.1 defined herein cannot be claimed to be compliant and cannot be marked "/883", "/883B", "/883S", or any variant thereof. All applicable documentation (including device specifications or manufacturer's data sheets and responses to RFQ's invoking MIL-STD-883) are required to clearly and specifically define any and all areas of nonconformance and identify them as deviations in language that is not subject to misinterpretation by the acquiring authority.
If the contract or order specifically requires compliance with, equivalence to, or a product that is equal to or better than MIL-STD-883 class B or class S, any exceptions taken to the requirements of the referenced quality level (i.e., 1.2.1 above) prohibit the manufacturer from claiming or implying equivalence to that level.
Specific reference to one or more MIL-STD-883 method(s) on a stand-alone basis requires compliance to only the specifically referenced method(s). Such devices are not considered compliant in accordance with 1.2.1 above. However, compliance with only the test procedures contained in test methods 5004, 5005, and 5010 on a stand-alone basis (without specifying compliance or noncompliance to 1.2.1) does not satisfy the requirement for form, fit, and function defined in MIL-PRF-38535 for configuration items, and any reference to these methods on a stand alone basis requires compliance to all the provisions of 1.2.1.
The test methods are designated by numbers assigned in accordance with the following system.
Classification of tests.
The test methods are divided into five areas and are contained in five parts of this multipart test method standard. Test methods numbered 1000 to 1999 inclusive, cover environmental tests and are in MIL-STD-883-1. Test methods numbered 2000 to 2999 inclusive, cover mechanical- characteristics tests and are in MIL-STD-883-2. Electrical- characteristics tests are covered in two groups; 3000 to 3999 inclusive, cover digital test methods MIL-STD-883-3 and 4000 to 4999 inclusive, cover analog test methods MIL-STD-883-4. Test methods numbered 5000 to 5999 inclusive, are for high reliability space applications and are in MIL-STD-883-5.
Test method revisions.
Test method revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, test method 1001.1 is the first revision of test method 1001.
Method of reference.
Test methods contained in this multipart test method standard should be referenced, when applicable, in the individual specification, specification sheet, or procurement documents by specifying the test method number and the details required in the summary of the applicable method. The basic standard should be referenced and not the individual part or parts of this standard (see 5.3). To avoid the necessity for changing documents that refer to this standard, the revision number of a test method should not be used when referencing individual test methods. For example, use 1001 as a reference versus 1001.2.
The intended use of this standard is to establish appropriate conditions for testing microcircuit devices to give test results that simulate the actual service conditions existing in the field.... View More
The intended use of this standard is to establish appropriate conditions for testing microcircuit devices to give test results that simulate the actual service conditions existing in the field. This standard has been prepared to provide uniform methods, controls, and procedures for determining with predictability the suitability of such devices within Military, Aerospace and special application equipment. This standard is applicable only to microelectronic devices, i.e. monolithic, multi-chip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed.View Less