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CENELEC - EN IEC 61837-2

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

active, Most Current
Organization: CENELEC
Publication Date: 1 July 2018
Status: active
Page Count: 110
ICS Code (Piezoelectric devices): 31.140
scope:

This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240:2016.

Document History

EN IEC 61837-2
July 1, 2018
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is...
EN IEC 61837-2
July 1, 2018
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is...
EN 61837-2
July 1, 2011
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is...
EN 61837-2
July 1, 2011
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is...
EN 61837-2
November 1, 2000
Surface Mounted Piezoelectric Devices for Frequency Control and Selection - Standard Outlines and Terminal Lead Connections Part 2: Ceramic Enclosures
A description is not available for this item.

References

This document references:
IEC 60122-2 - Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection
Published by IEC on January 1, 1983
A description is not available for this item.
This document references:
IEC 60122-3 - Quartz crystal units of assessed quality – Part 3: Standard outlines and lead connections
Published by IEC on October 1, 2010
This part of IEC 60122 specifies the outline drawing for quartz crystal units with lead enclosures.
This document references:
IEC 60191-6 - Mechanical standardization of semiconductor devices – Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Published by IEC on November 1, 2009
This part of IEC 60191 gives general rules for the preparation of outline drawings of surfacemounted semiconductor devices. It supplements IEC 60191-1 and IEC 60191-3. It covers all surface-mounted...
This document references:
IEC 60368-1 - Piezoelectric filters of assessed quality – Part 1: Generic specification
Published by IEC on May 1, 2013
This part of IEC 60368 specifies the methods of test and general requirements for piezoelectric filters of assessed quality using either capability approval or qualification approval procedures.
This document references:
IEC 60368-2-1 - Piezoelectric Filters Part 2: Guide to the Use of Piezoelectric Filters Section One - Quartz Crystal Filters
Published by IEC on June 1, 1988
A description is not available for this item.
This document is referenced by:
BS EN 62884-1 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Part 1: Basic methods for the measurement
Published by BSI on October 31, 2017
A description is not available for this item.
This document is referenced by:
BS EN 60444-8 - Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
Published by BSI on May 31, 2017
A description is not available for this item.
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