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BSI - BS EN 60191-6-19

Mechanical standardization of semiconductor devices Part 6-19: Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage

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Organization: BSI
Publication Date: 30 June 2010
Status: active
Page Count: 18
ICS Code (Semiconductor devices in general): 31.080.01

Document History

BS EN 60191-6-19
June 30, 2010
Mechanical standardization of semiconductor devices Part 6-19: Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage
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References

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