BSI - BS EN 60191-6-19
Mechanical standardization of semiconductor devices Part 6-19: Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage
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Organization: | BSI |
Publication Date: | 30 June 2010 |
Status: | active |
Page Count: | 18 |
ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
BS EN 60191-6-19
June 30, 2010
Mechanical standardization of semiconductor devices Part 6-19: Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage
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