DLA - SMD-5962-94585 REV A
MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, 128K X 32-BIT, ELECTRICALLY ERASABLE/PROGRAMMABLE READ ONLY MEMORY
Organization: | DLA |
Publication Date: | 25 September 1996 |
Status: | inactive |
Page Count: | 30 |
scope:
This drawing documents two product assurance classes, high reliability (device class H) and space application (device class K) and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.
The PIN shall be as shown in the following example:
Device classes H and K RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) shall identify the circuit function as follows:
Device type Generic number Circuit function Access time 01 WE-128K32-300HQ EEPROM, 128K × 32-bit 300 ns 02 WE-128K32-250HQ EEPROM, 128K × 32-bit 250 ns 03 WE-128K32-200HQ EEPROM, 128K × 32-bit 200 ns 04 WE-128K32-150HQ EEPROM, 128K × 32-bit 150 ns
This device class designator shall be a single letter identifying the product assurance level as follows:
Device class Device performance documentation H or K Certification and qualification to MIL-PRF-38534
The case outline(s) shall be as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style M See figure 1 68 Ceramic, dual cavity, quad flatpak N See figure 1 68 Ceramic, quad flatpak T See figure 1 66 Hex-in-line, single cavity, with standoffs U See figure 1 66 Hex-in-line, single cavity, without standoffs X See figure 1 66 Hex-in-line, single cavity, with standoffs Y See figure 1 66 Hex-in-line, single cavity, without standoffs 4 See figure 1 66 1.075", hex-in-line, single cavity, with standoffs 5 See figure 1 66 1.075", hex-in-line, single cavity, with standoffs
The lead finish shall be as specified in MIL-PRF-38534 for classes H and K.
Supply voltage range (VCC) ....................
Supply voltage range (VCC) ....................
The following specification, standards, and handbook form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the salutation.
SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management MIL-STD-1835 - Microcircuit Case Outlines. HANDBOOK DEPARTMENT OF DEFENSE MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbook are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document however, supersedes applicable laws and regulations unless a specific exemption has been obtained.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
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