JEDEC JESD 78
IC Latch-Up Test
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Organization: | JEDEC |
Publication Date: | 1 March 1997 |
Status: | inactive |
Page Count: | 22 |
Document History

November 1, 2023
IC Latch-Up Test
This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to...

December 1, 2022
IC Latch-Up Test
This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to...

January 1, 2022
IC Latch-Up Test
This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to...

April 1, 2016
IC Latch-Up Test
This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits.
The purpose of this standard is to establish a method for determining IC latch-up characteristics and...

November 1, 2011
IC Latch-Up Test
This standard covers the I-test and the overvoltage latch-up testing of integrated circuits.
The purpose of this specification is to establish a method for determining IC latch-up characteristics...

September 1, 2010
IC Latch-Up Test
This specification covers the I-test and the overvoltage latch-up testing of integrated circuits.
The purpose of this specification is to establish a method for determining IC latch-up...

December 1, 2008
IC Latch-Up Test
This standard has been adopted by the Defense Logistics Agency (DLA) as project 5962-1880. This standard establishes a defined method for latch-up testing of ICs. It defines Classes and Levels for a...

February 1, 2006
IC Latch-Up Test
This specification covers the I-test and the overvoltage latch-up testing of integrated circuits.
Purpose
The purpose of this specification is to establish a method for determining IC latch-up...

JEDEC JESD 78
March 1, 1997
IC Latch-Up Test
A description is not available for this item.