JEDEC JESD 78
IC Latch-Up Test
inactive
Buy Now
| Organization: | JEDEC |
| Publication Date: | 1 February 2006 |
| Status: | inactive |
| Page Count: | 30 |
scope:
This specification covers the I-test and the overvoltage latch-up testing of integrated circuits.
Purpose
The purpose of this specification is to establish a method for determining IC latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are extremely important in determining product reliability and minimizing No Trouble Found (NTF) and Electrical Overstress (EOS) failures due to latch-up. This test method is applicable to NMOS, CMOS, bipolar, and all variations and combinations of these technologies.
Document History
November 1, 2023
IC Latch-Up Test
This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to...
December 1, 2022
IC Latch-Up Test
This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to...
January 1, 2022
IC Latch-Up Test
This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to...
April 1, 2016
IC Latch-Up Test
This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits.
The purpose of this standard is to establish a method for determining IC latch-up characteristics and...
November 1, 2011
IC Latch-Up Test
This standard covers the I-test and the overvoltage latch-up testing of integrated circuits.
The purpose of this specification is to establish a method for determining IC latch-up characteristics...
September 1, 2010
IC Latch-Up Test
This specification covers the I-test and the overvoltage latch-up testing of integrated circuits.
The purpose of this specification is to establish a method for determining IC latch-up...
December 1, 2008
IC Latch-Up Test
This standard has been adopted by the Defense Logistics Agency (DLA) as project 5962-1880. This standard establishes a defined method for latch-up testing of ICs. It defines Classes and Levels for a...
JEDEC JESD 78
February 1, 2006
IC Latch-Up Test
This specification covers the I-test and the overvoltage latch-up testing of integrated circuits.
Purpose
The purpose of this specification is to establish a method for determining IC latch-up...