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JEDEC JEB 5 - Methods of Measurement for Semiconductor Logic Gating Microcircuits
January 1, 1970 - JEDEC

The purpose of this bulletin is to recommend for use in the rating of semiconductor logic gating microcircuits which use the binary states to represent and process logic information. Both static and dynamic measurements are covered.

SMD 5962-08242 - MICROCIRCUIT, HYBRID, HIGH SPEED LOGIC GATE 3.3V OPTOCOUPLER
December 3, 2018 - DOD

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are...

SMD 5962-88769 - MICROCIRCUIT, HYBRID, DIGITAL, DUAL AND QUAD CHANNEL, HIGH SPEED LOGIC GATE OPTOCOUPLER
June 6, 2017 - DOD

This drawing describes device requirements for hybrid microcircuits to be processed in accordance with MILPRF- 38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance...

SMD 5962-88768 - MICROCIRCUIT, HYBRID, DIGITAL, SINGLE CHANNEL, HIGH SPEED LOGIC GATE OPTICALLY COUPLED ISOLATOR
June 6, 2017 - DOD

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are...

SMD 5962-84031 - MICROCIRCUIT, DIGITAL, ADVANCED LOWPOWER SCHOTTKY TTL, LOGIC GATE WITH BUFFER OUTPUT, MONOLITHIC SILICON
March 25, 2015 - DOD

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

SMD 5962-15239 - MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, DUAL, SEQUENTIAL, MANYGATE CONFIGURABLE LOGIC GATE WITH SCHMITT TRIGGER INPUTS AND TRI-STATE OUTPUTS, MONOLITHIC SILICON
October 30, 2017 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-15238 - MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, TRIPLE, COMBINATIONAL, MANYGATE CONFIGURABLE LOGIC GATE WITH SCHMITT TRIGGER INPUTS AND TRI-STATE OUTPUTS, MONOLITHIC SILICON
October 30, 2017 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-95521 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 10,000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
July 18, 2018 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-92252 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS 5000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
January 3, 2018 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-89948 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS 2000 GATE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
October 20, 2016 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-89713 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS 4200 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
September 19, 2016 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-98513 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 13000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
June 24, 2016 - DOD

This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or...

SMD 5962-98511 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 62000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
June 6, 2016 - DOD

This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or...

SMD 5962-98510 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 36000 GATE PROGRAMMABLE LOGIC ARRAY MONOLITHIC SILICON
May 16, 2016 - DOD

This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or...

SMD 5962-98509 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 28000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
April 1, 2016 - DOD

This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or...

SMD 5962-89823 - MICROCIRCUITS, MEMORY, DIGITAL, CMOS 9000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
November 18, 2015 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-92305 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS 10000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
May 9, 2014 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-95612 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS 9500 GATE PROGRAMMABLE LOGIC ARRAY,MONOLITHIC SILICON
April 1, 2014 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

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