Standards Library

10,501-11,000 of 21,454 results for "Electronics"

ASTM C1212-98(2010)
Title: Standard Practice for Fabricating Ceramic Reference Specimens Containing Seeded Voids
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F1467-99(2005)e1
Title: Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F996-11
Title: Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Volta...
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F2866-10
Title: Standard Test Method for Flammability of a Membrane Switch in Defined Assembly
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1942-98(2010)
Title: Standard Guide for Evaluating Data Acquisition Systems Used in Cyclic Fatigue and Fracture Mechanics Testing
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F1893-11
Title: Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E2567-11
Title: Standard Test Method for Determining Nodularity And Nodule Count In Ductile Iron Using Image Analysis
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM C159-06(2011)
Title: Standard Specification for Vitrified Clay Filter Blocks
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1316-11
Title: Standard Terminology for Nondestructive Examinations
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM C1060-11
Title: Standard Practice for Thermographic Inspection of Insulation Installations in Envelope Cavities of Frame Buildings
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM C1060-11a
Title: Standard Practice for Thermographic Inspection of Insulation Installations in Envelope Cavities of Frame Buildings
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM C1674-11
Title: Standard Test Method for Flexural Strength of Advanced Ceramics with Engineered Porosity (Honeycomb Cellular Channels) at Ambient Temperatures
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM D4748-10
Title: Standard Test Method for Determining the Thickness of Bound Pavement Layers Using Short-Pulse Radar
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E2710-11
Title: Standard Guide for Preservation of Charred Documents
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM D4956-11a
Title: Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F2247-11
Title: Standard Test Method for Metal Doors Used in Blast Resistant Applications (Equivalent Static Load Method)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM B187/B187M-11
Title: Standard Specification for Copper, Bus Bar, Rod, and Shapes and General Purpose Rod, Bar, and Shapes
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E1796-03(2011)e1
Title: Standard Guide for Selection and Use of Liquid Coating Encapsulation Products for Leaded Paint in Buildings
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E2710-11e1
Title: Standard Guide for Preservation of Charred Documents (Withdrawn 2020)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM D4196-05(2011)
Title: Standard Test Method for Confirming the Sterility of Membrane Filters
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E977-84(1999)
Title: Standard Practice for Thermoelectric Sorting of Electrically Conductive Materials
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F316-03(2011)
Title: Standard Test Methods for Pore Size Characteristics of Membrane Filters by Bubble Point and Mean Flow Pore Test
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E986-97
Title: Standard Practice for Scanning Electron Microscope Beam Size Characterization
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F448-11
Title: Test Method for Measuring Steady-State Primary Photocurrent
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1263-11
Title: Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1238-95(2011)
Title: Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications (Withdrawn 2020)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1367-98(2011)
Title: Standard Specification for Chromium Sputtering Targets for Thin Film Applications (Withdrawn 2020)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1512-94(2011)
Title: Standard Practice for Ultrasonic C-Scan Bond Evaluation of Sputtering Target-Backing Plate Assemblies (Withdrawn 2020)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1513-99(2011)
Title: Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications (Withdrawn 2020)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1761-00(2011)
Title: Standard Test Method for Pass Through Flux of Circular Magnetic Sputtering Targets (Withdrawn 2020)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1894-98(2011)
Title: Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness (Withdrawn 2020)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F2113-01(2011)
Title: Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications (Withdrawn 2020)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E1316-11a
Title: Standard Terminology for Nondestructive Examinations
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E1441-11
Title: Standard Guide for Computed Tomography (CT) Imaging
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E1570-11
Title: Standard Practice for Computed Tomographic (CT) Examination
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM G166-00(2011)
Title: Standard Guide for Statistical Analysis of Service Life Data
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F2866-11
Title: Standard Test Method for Flammability of a Membrane Switch in Defined Assembly
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F2865-11
Title: Standard Guide for Classifying the Degrees of Ingression Protection Provided by a Membrane Switch
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F2359-04(2011)
Title: Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM D5138-11
Title: Standard Classification System and Basis for Specification for Liquid Crystal Polymers Molding and Extrusion Materials (LCP)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1281-11
Title: Standard Specification for Crosslinked Polyethylene/Aluminum/Crosslinked Polyethylene (PEX-AL-PEX) Pressure Pipe
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E1916-11
Title: Standard Guide for Identification of Mixed Lots of Metals
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM B615-79(2011)
Title: Standard Practice for Measuring Electrical Contact Noise in Sliding Electrical Contacts
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1467-11
Title: Standard Guide for Use of an X-Ray Tester (<span class='unicode'>&#x2248;</span>10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1190-11
Title: Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1192-11
Title: Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1541-02(2011)
Title: Standard Specification and Test Methods for External Skeletal Fixation Devices
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E128-99(2011)
Title: Standard Test Method for Maximum Pore Diameter and Permeability of Rigid Porous Filters for Laboratory Use
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM D7147-11
Title: Standard Specification for Testing and Establishing Allowable Loads of Joist Hangers
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E1122-96
Title: Standard Practice for Obtaining JK Inclusion Ratings Using Automatic Image Analysis
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM E1942-98(2010)e1
Title: Standard Guide for Evaluating Data Acquisition Systems Used in Cyclic Fatigue and Fracture Mechanics Testing
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1438-11
Title: Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E2444-11
Title: Terminology Relating to Measurements Taken on Thin, Reflecting Films
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E1161-95
Title: Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
Organization: ASTM International
Year: 1994
Status: Inactive
ASTM E1635-06(2011)
Title: Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E1657-98(2011)
Title: Standard Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E1316-11b
Title: Standard Terminology for Nondestructive Examinations
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM D3849-07(2011)
Title: Standard Test Method for Carbon Black&mdash;Morphological Characterization of Carbon Black Using Electron Microscopy
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F91-06(2011)
Title: Standard Practice for Testing for Leaks in the Filters Associated With Laminar Flow Clean Rooms and Clean Work Stations by Use of a Condensation Nuclei Detector
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM E1217-00
Title: Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM E1245-00
Title: Standard Practice for Determining the Inclusion or Second-Phase Constituent Content of Metals by Automatic Image Analysis
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM E1250-88(2000)
Title: Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM B49-98e2
Title: Standard Specification for Copper Rod Drawing Stock for Electrical Purposes
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F1595-00(2012)
Title: Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM F1689-05(2012)
Title: Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM E431-96(2011)
Title: Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F18-12
Title: Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM F1995-12
Title: Standard Test Method for Determining the Shear Force of a Surface Mount Device (SMD) in a Membrane Switch
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM F360-82(2011)
Title: Standard Practice for Image Evaluation of Electrostatic Business Copies (Withdrawn 2020)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F505-87(2011)
Title: Standard Practice for Comparative Evaluation of Imaging Properties of Liquid Electrostatic Toners (Withdrawn 2020)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F686-94(2011)
Title: Standard Practice for Evaluation of Image Quality Produced by Carbonless Copy Paper with an Electric or Electronic Typewriter (Withdrawn 2020)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F1320-01(2011)
Title: Standard Test Method for Evaluating Thermal Paper Employing a Facsimile Thermal Printer as a Test Instrument (Withdrawn 2020)
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM F2944-12
Title: Standard Test Method for Automated Colony Forming Unit (CFU) Assays&mdash;Image Acquisition and Analysis Method for Enumerating and Characterizing Cells and Colonies in Culture
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM F2884-12
Title: Standard Guide for Pre-clinical <emph type="bdit">in vivo</emph> Evaluation of Spinal Fusion (Withdrawn 2021)
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM E1303-95(2000)
Title: Practice for Refractive Index Detectors Used in Liquid Chromatography
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM E1362-99
Title: Standard Test Method for Calibration of Non-Concentrator Photovoltaic Secondary Reference Cells
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1264-03(2012)
Title: Standard Specification and Test Methods for Intramedullary Fixation Devices
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM E1795-12
Title: Standard Specification for Non-Reinforced Liquid Coating Encapsulation Products for Leaded Paint in Buildings
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM F1541-02(2011)e1
Title: Standard Specification and Test Methods for External Skeletal Fixation Devices
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM C1746/C1746M-12
Title: Standard Test Method for Measurement of Suspended Sediment Removal Efficiency of Hydrodynamic Stormwater Separators and Underground Settling Devices
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM F2964-12
Title: Standard Test Method for Determining the Uniformity of the Luminance of an Electroluminescent Lamp or Other Diffuse Lighting Device
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM F29-97(2012)
Title: Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM F1375-92(2012)
Title: Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM E2444-11e1
Title: Terminology Relating to Measurements Taken on Thin, Reflecting Films
Organization: ASTM International
Year: 2011
Status: Inactive
ASTM B84-90(2001)
Title: Standard Test Method for Temperature-Resistance Constants of Alloy Wires for Precision Resistors
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM E1797-12
Title: Standard Specification for Reinforced Liquid Coating Encapsulation Products for Leaded Paint in Buildings
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM B984-12
Title: Standard Specification for Electrodeposited Coatings of Palladium- Cobalt Alloy for Engineering Use
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM F1892-12
Title: Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM E2301-12
Title: Standard Test Method for Daytime Colorimetric Properties of Fluorescent Retroreflective Sheeting and Marking Materials for High Visibility Traffic Control and Personal Safety Applications Using 45<...
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM E1437-98
Title: Standard Practice for Handling Silicon Carbide Whiskers (Withdrawn 2007)
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM E1438-91(2001)
Title: Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
Organization: ASTM International
Year: 1991
Status: Inactive
ASTM D5127-12
Title: Standard Guide for Ultra-Pure Water Used in the Electronics and Semiconductor Industries
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM E1458-92(2001)
Title: Standard Test Method for Calibration Verification of Laser Diffraction Particle Sizing Instruments Using Photomask Reticles (Withdrawn 2010)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F2603-06(2012)
Title: Standard Guide for Interpreting Images of Polymeric Tissue Scaffolds
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM E1467-94(2000)
Title: Standard Specification for Transferring Digital Neurophysiological Data Between Independent Computer Systems (Withdrawn 2004)
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM E1476-97
Title: Standard Guide for Metals Identification, Grade Verification, and Sorting
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM B888-12
Title: Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM D5109-12
Title: Standard Test Methods for Copper-Clad Thermosetting Laminates for Printed Wiring Boards (Withdrawn 2020)
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM D6095-12
Title: Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM F1174-12
Title: Standard Practice for Using a Personal Computer Printer as a Test Instrument
Organization: ASTM International
Year: 2012
Status: Active
ASTM D6285-99(2012)e1
Title: Standard Guide for Locating Abandoned Wells
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM B193-87(1992)
Title: Standard Test Method for Resistivity of Electrical Conductor Materials
Organization: ASTM International
Year: 1986
Status: Inactive
ASTM F640-12
Title: Standard Test Methods for Determining Radiopacity for Medical Use
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM F2865-13
Title: Standard Guide for Classifying the Degrees of Ingress of Dust and Water into a Membrane Switch
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM E1606-99
Title: Standard Practice for Electromagnetic (Eddy-Current) Examination of Copper Redraw Rod for Electrical Purposes
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM B354-12
Title: Standard Terminology Relating to Uninsulated Metallic Electrical Conductors
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM E1654-94(2013)
Title: Standard Guide for Measuring Ionizing Radiation-Induced Spectral Changes in Optical Fibers and Cables for Use in Remote Raman FiberOptic Spectroscopy
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM E668-13
Title: Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
Organization: ASTM International
Year: 2012
Status: Active
ASTM E1647-98a
Title: Standard Practice for Determining Contrast Sensitivity in Radioscopy
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM E1654-94(1999)
Title: Standard Guide for Measuring Ionizing Radiation-Induced Spectral Changes in Optical Fibers and Cables for Use in Remote Raman FiberOptic Spectroscopy
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM E1657-98(2001)
Title: Standard Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM E2567-13
Title: Standard Test Method for Determining Nodularity And Nodule Count In Ductile Iron Using Image Analysis
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM E2567-12a
Title: Standard Test Method for Determining Nodularity And Nodule Count In Ductile Iron Using Image Analysis
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM B542-13
Title: Standard Terminology Relating to Electrical Contacts and Their Use
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM E1686-96
Title: Standard Guide for Selection of Environmental Noise Measurements and Criteria
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM D5127-13
Title: Standard Guide for Ultra-Pure Water Used in the Electronics and Semiconductor Industries
Organization: ASTM International
Year: 2012
Status: Inactive
ASTM D5071-06(2013)
Title: Standard Practice for Exposure of Photodegradable Plastics in a Xenon Arc Apparatus
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM E1713-95
Title: Standard Specification for Transferring Digital Waveform Data Between Independent Computer Systems (Withdrawn 2004)
Organization: ASTM International
Year: 1994
Status: Inactive
ASTM B738-13
Title: Standard Specification for Fine-Wire Bunch-Stranded and Rope-Lay Bunch-Stranded Copper Conductors for Use as Electrical Conductors
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F677-13
Title: Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications (Withdrawn 2013)
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM D5933-96(2013)
Title: Standard Specification for 2 5/8-in. and 4-in. Diameter Metal Shear Plates for Use in Wood Constructions
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F2943-13
Title: Standard Guide for Presentation of End User Labeling Information for Orthopedic Implants Used in Joint Arthroplasty
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM B84-07(2013)
Title: Standard Test Method for Temperature-Resistance Constants of Alloy Wires for Precision Resistors
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM B267-07(2013)
Title: Standard Specification for Wire for Use In Wire-Wound Resistors
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F83-71(2013)
Title: Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F85-76(2013)
Title: Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F615M-95(2013)
Title: Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric) (Withdrawn 2022)
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F1995-13
Title: Standard Test Method for Determining the Shear Strength of the Bond between a Surface Mount Device (SMD) and Substrate in a Membrane Switch
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F1-94(2000)
Title: Standard Specification for Nickel-Clad and Nickel-Plated Steel Strip for Electron Tubes
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F3-02
Title: Standard Specification for Nickel Strip for Electron Tubes
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F4-66(1999)
Title: Standard Specification for Carbonized Nickel Strip and Carbonized Nickel-Plated and Nickel-Clad Steel Strip for Electron Tubes
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM D4496-13
Title: Standard Test Method for D-C Resistance or Conductance of Moderately Conductive Materials
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F18-64(2000)
Title: Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM E1854-13
Title: Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F26-87a(1999)
Title: Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal (Withdrawn 2003)
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F28-91(1997)
Title: Standard Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F43-99
Title: Standard Test Methods for Resistivity of Semiconductor Materials (Withdrawn 2003)
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F71-68(1999)
Title: Standard Practice for Using the Morphological Key for the Rapid Identification of Fibers for Contamination Control in Electron Devices and Microelectronics (Withdrawn 2005)
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM E2916-13
Title: Standard Terminology for Digital and Multimedia Evidence Examination
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F76-86(2002)
Title: Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Organization: ASTM International
Year: 1986
Status: Inactive
ASTM D3862-13
Title: Standard Test Method for Retention Characteristics of 0.2-&#181m Membrane Filters Used in Routine Filtration Procedures for the Evaluation of Microbiological Water Quality
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM B539-02(2013)
Title: Standard Test Methods for Measuring Resistance of Electrical Connections (Static Contacts)
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F77-69(1996)
Title: Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM F80-94
Title: Test Method for Crystallographic Perfection of Epitaxial Deposits of Silicon by Etching Techniques (Withdrawn 1998)
Organization: ASTM International
Year: 1993
Status: Inactive
ASTM F81-01
Title: Standard Test Method for Measuring Radial Resistivity Variation on Silicon Wafers (Withdrawn 2003)
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F83-71(2002)
Title: Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
Organization: ASTM International
Year: 1971
Status: Inactive
ASTM F85-76(1997)e1
Title: Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F91-70(2001)e1
Title: Standard Practice for Testing for Leaks in the Filters Associated With Laminar Flow Clean Rooms and Clean Work Stations by Use of a Condensation Nuclei Detector
Organization: ASTM International
Year: 1970
Status: Inactive
ASTM F95-89(2000)
Title: Standard Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer (Withdrawn 2003)
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F110-00a
Title: Standard Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique (Withdrawn 2003)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F111-96(2002)
Title: Standard Practice for Determining Barium Yield, Getter Gas Content, and Getter Sorption Capacity for Barium Flash Getters (Withdrawn 2008)
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM E1854-96
Title: Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM E2567-13a
Title: Standard Test Method for Determining Nodularity And Nodule Count In Ductile Iron Using Image Analysis
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM B888/B888M-13
Title: Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM E1578-13
Title: Standard Guide for Laboratory Informatics
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F358-83(2002)
Title: Standard Test Method for Wavelength of Peak Photoluminescence and the Corresponding Composition of Gallium Arsenide Phosphide Wafers (Withdrawn 2008)
Organization: ASTM International
Year: 1983
Status: Inactive
ASTM F360-82(2001)
Title: Standard Practice for Image Evaluation of Electrostatic Business Copies
Organization: ASTM International
Year: 1982
Status: Inactive
ASTM F364-96(2002)
Title: Standard Specification for Molybdenum Flattened Wire for Electron Tubes
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM F374-00a
Title: Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM D1867-13
Title: Standard Specification for Copper-Clad Thermosetting Laminates for Printed Wiring (Withdrawn 2020)
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F375-89(1999)
Title: Standard Specification for Integrated Circuit Lead Frame Material
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM E2651-13
Title: Standard Guide for Powder Particle Size Analysis
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F391-96
Title: Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM F399-00a
Title: Standard Test Method for Thickness of Heteroepitaxial or Polysilicon Layers (Withdrawn 2002)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F416-94
Title: Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998)
Organization: ASTM International
Year: 1993
Status: Inactive
ASTM F418-77(2002)
Title: Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements (Withdrawn 2008)
Organization: ASTM International
Year: 1977
Status: Inactive
ASTM D3004-08(2013)
Title: Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F419-94
Title: Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)
Organization: ASTM International
Year: 1993
Status: Inactive
ASTM D7879-13
Title: Standard Test Method for Determining Flax Fiber Widths Using Image Analysis
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM D4956-13
Title: Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F1762-14
Title: Standard Test Method for Determining the Effects of Atmospheric Pressure Variation on a Membrane Switch (Withdrawn 2023)
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F1895-14
Title: Standard Test Method for Submersion of a Membrane Switch (Withdrawn 2023)
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F2072-14
Title: Standard Test Method for Hosedown of a Membrane Switch (Withdrawn 2023)
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F2997-13
Title: Standard Practice for Quantification of Calcium Deposits in Osteogenic Culture of Progenitor Cells Using Fluorescent Image Analysis
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM F448M-94
Title: Test Method for Measuring Steady-State Primary Photocurrent [Metric] (Withdrawn 1999)
Organization: ASTM International
Year: 1993
Status: Inactive
ASTM F1562-14
Title: Standard Guide for Use-Oriented Foreign Language Instruction
Organization: ASTM International
Year: 2014
Status: Active
ASTM E1574-98(2014)
Title: Standard Test Method for Measurement of Sound in Residential Spaces
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F497-00
Title: Standard Practice for Use of the Electric and Electronic Typewriter as a Test Instrument
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F505-87(2001)
Title: Standard Practice for the Comparative Evaluation of the Imaging Properties of Liquid Electrostatic Toners
Organization: ASTM International
Year: 1987
Status: Inactive
ASTM F522-94
Title: Test Method for Stacking Fault Density of Epitaxial Layers of Silicon by Interference-Contrast Microscopy (Withdrawn 1998)
Organization: ASTM International
Year: 1993
Status: Inactive
ASTM F523-93(1997)
Title: Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F1761-00
Title: Standard Test Method for Pass Through Flux of Circular Magnetic Sputtering Targets
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F524-77(1992)
Title: Test Methods for Measuring Beam Divergence of Pulsed Lasers by the Apertured-Detector Technique (Withdrawn 2001)
Organization: ASTM International
Year: 1991
Status: Inactive
ASTM F525-00a
Title: Standard Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe (Withdrawn 2003)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F528-99
Title: Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM B193-02(2014)
Title: Standard Test Method for Resistivity of Electrical Conductor Materials
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F533-02
Title: Standard Test Method for Thickness and Thickness Variation of Silicon Wafers
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F534-02
Title: Standard Test Method for Bow of Silicon Wafers
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F542-98
Title: Standard Test Method for Exothermic Temperature of Encapsulating Compounds for Electronic and Microelectronic Encapsulation
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F2998-14
Title: Guide for Using Fluorescence Microscopy to Quantify the Spread Area of Fixed Cells (Withdrawn 2023)
Organization: ASTM International
Year: 2013
Status: Inactive
ASTM C346-87(2014)
Title: Standard Test Method for 45-deg Specular Gloss of Ceramic Materials
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F576-01
Title: Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry (Withdrawn 2003)
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F2943-14
Title: Standard Guide for Presentation of End User Labeling Information for Musculoskeletal Implants
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F1578-07(2014)
Title: Standard Test Method for Contact Closure Cycling of a Membrane Switch (Withdrawn 2023)
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F1221-89(2014)
Title: Standard Guide for Interagency Information Exchange
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM E977-05(2014)
Title: Standard Practice for Thermoelectric Sorting of Electrically Conductive Materials
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM E1161-09(2014)
Title: Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F596-82(1998)
Title: Standard Practice for Comparative Evaluation of the Imaging Properties of Dry Electrostatic Toners
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F597-83(1998)e1
Title: Standard Practice for Evaluation of One-Time Carbon Paper in Carbon-Interleaved Business Forms by Use of an Electric Typewriter
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM E566-14
Title: Standard Practice for Electromagnetic &#40;Eddy Current&#41; Sorting of Ferrous Metals
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM E703-14
Title: Standard Practice for Electromagnetic &#40;Eddy Current&#41; Sorting of Nonferrous Metals
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F364-96(2014)
Title: Standard Specification for Molybdenum Flattened Wire for Electron Tubes&nbsp;
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F1598-95(2014)
Title: Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay &#40;Spot Test Method&#41; (Withdrawn 2023)
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F615M-95
Title: Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components [Metric]
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM F616-92
Title: Standard Test Method for Measuring MOSFET Drain Leakage Current
Organization: ASTM International
Year: 1991
Status: Inactive
ASTM F617-00
Title: Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F637-85(2001)
Title: Standard Specification for Format, Physical Properties, and Test Methods for 19 and 35 mm Testable Tape Carrier for Perimeter Tape Carrier-Bonded Semiconductor Devices (Withdrawn 2006)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F3080-14
Title: Standard Practice for Laser Technologies for Measurement of Cross-Sectional Shape of Pipeline and Conduit by Non-Rotating Laser Projector and CCTV Camera System
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F640-79(2000)
Title: Standard Test Methods for Radiopacity of Plastics for Medical Use
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F641-98a
Title: Standard Specification for Implantable Epoxy Electronic Encapsulants
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F653-84(1998)e1
Title: Standard Test Method for Evaluation of Electrostatic Masters (Withdrawn 2002)
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F3095-14
Title: Standard Practice for Laser Technologies for Direct Measurement of Cross Sectional Shape of Pipeline and Conduit by Rotating Laser Diodes and CCTV Camera System
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F657-92(1999)
Title: Standard Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning (Withdrawn 2003)
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM B634-14
Title: Standard Specification for Electrodeposited Coatings of Rhodium for Engineering Use
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F671-99
Title: Standard Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials (Withdrawn 2003)
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F672-01
Title: Standard Test Method for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe (Withdrawn 2003)
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F673-90(1996)e1
Title: Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM F674-92(1999)
Title: Standard Practice for Preparing Silicon for Spreading Resistance Measurements (Withdrawn 2003)
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F676-97
Title: Standard Test Method for Measuring Unsaturated TTL Sink Current
Organization: ASTM International
Year: 1992
Status: Inactive
ASTM F677-95(1999)
Title: Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F686-94(2001)
Title: Standard Practice for Evaluation of Image Quality Produced by a Carbonless Copy Paper with an Electric or Electronic Typewriter
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F980-10e1
Title: Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E722-14
Title: Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F723-99
Title: Standard Practice for Conversion Between Resistivity and Dopant Density for Boron-Doped, Phosphorus-Doped, and Arsenic-Doped Silicon (Withdrawn 2003)
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F2073-14
Title: Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch (Withdrawn 2023)
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM B187-00e1
Title: Standard Specification for Copper Bar, Bus Bar, Rod, and Shapes
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM D3380-14
Title: Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM B634-14a
Title: Standard Specification for Electrodeposited Coatings of Rhodium for Engineering Use
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F744M-97
Title: Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM F754-00
Title: Standard Specification for Implantable Polytetrafluoroethylene (PTFE) Polymer Fabricated in Sheet, Tube, and Rod Shapes
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F763-99
Title: Standard Practice for Short-Term Screening of Implant Materials
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F773-92
Title: Practice for Measuring Dose Rate Response of Linear Integrated Circuits
Organization: ASTM International
Year: 1991
Status: Inactive
ASTM B193-02
Title: Standard Test Method for Resistivity of Electrical Conductor Materials
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F815-88(1993)e1
Title: Test Method for Detection of Epitaxial Spikes (Withdrawn 1999)
Organization: ASTM International
Year: 1992
Status: Inactive
ASTM F816-83(1998)e1
Title: Standard Test Method for Combined Fine and Gross Leaks for Large Hybrid Microcircuit Packages
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F847-94(1999)
Title: Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F867M-94A
Title: Guide for Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices [Metric] (Withdrawn 1998)
Organization: ASTM International
Year: 1993
Status: Inactive
ASTM F875-94(1998)
Title: Standard Test Method for Evaluation of Large Area Density and Background on Office Copiers
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM E2567-14
Title: Standard Test Method for Determining Nodularity And Nodule Count In Ductile Iron Using Image Analysis
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F2721-09(2014)
Title: Standard Guide for Pre-clinical <emph type="bdit">in vivo</emph> Evaluation in Critical Size Segmental Bone Defects
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM F1264-14
Title: Standard Specification and Test Methods for Intramedullary Fixation Devices
Organization: ASTM International
Year: 2014
Status: Inactive
ASTM D7145-05(2015)
Title: Standard Guide for Measurement of Atmospheric Wind and Turbulence Profiles by Acoustic Means
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM B885-09(2015)
Title: Standard Test Method for Presence of Foreign Matter on Printed Wiring Board Contacts
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM F928-02
Title: Standard Test Methods for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM B49-15
Title: Standard Specification for Copper Rod for Electrical Purposes
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM F1762-02
Title: Standard Practice for Exposing a Membrane Switch to Variation in Atmospheric Pressure
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F950-98
Title: Standard Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Slice Surface by Angle Polishing and Defect Etching
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F951-02
Title: Standard Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F2895-15
Title: Standard Practice for Digital Radiography of Cast Metallic Implants
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM D4748-10(2015)
Title: Standard Test Method for Determining the Thickness of Bound Pavement Layers Using Short-Pulse Radar
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM B187/B187M-15
Title: Standard Specification for Copper, Bus Bar, Rod, and Shapes and General Purpose Rod, Bar, and Shapes
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM E1127-08(2015)
Title: Standard Guide for Depth Profiling in Auger Electron Spectroscopy
Organization: ASTM International
Year: 2015
Status: Active
ASTM F978-02
Title: Standard Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques (Withdrawn 2003)
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F980-92
Title: Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Organization: ASTM International
Year: 1991
Status: Inactive
ASTM F981-99
Title: Standard Practice for Assessment of Compatibility of Biomaterials for Surgical Implants with Respect to Effect of Materials on Muscle and Bone
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F2218-02(2015)
Title: Standard Guide for Hardware Implementation for Computerized Systems
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM F2360-08(2015)e1
Title: Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source
Organization: ASTM International
Year: 2015
Status: Active
ASTM F996-98
Title: Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Volta...
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM E1250-15
Title: Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
Organization: ASTM International
Year: 2015
Status: Active
ASTM F1843-15
Title: Standard Practice for Sample Preparation of Plastic Films used on Membrane Switch Overlays for Specular Gloss Measurements
Organization: ASTM International
Year: 2015
Status: Active
ASTM F1842-15
Title: Standard Test Method for Determining Ink or Coating Adhesion on Flexible Substrates for a Membrane Switch or Printed Electronic Device
Organization: ASTM International
Year: 2015
Status: Active
ASTM F3147-15
Title: Standard Test Method for Evaluating the Reliability of Surface Mounted Device (SMD) Joints on a Flexible Circuit by a Rolling Mandrel Bend
Organization: ASTM International
Year: 2015
Status: Active
ASTM F1812-15
Title: Standard Test Method for Determining the Effect of an ESD Discharge on a Membrane Switch or Printed Electronic Device
Organization: ASTM International
Year: 2015
Status: Active
ASTM F1596-15
Title: Standard Test Method for Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity
Organization: ASTM International
Year: 2015
Status: Active
ASTM F1027-86(1995)e1
Title: Standard Practice for Assessment of Tissue and Cell Compatibility of Orofacial Prosthetic Materials and Devices
Organization: ASTM International
Year: 1994
Status: Inactive
ASTM F3152-15
Title: Standard Test Method for Determining Abrasion Resistance of Inks and Coatings on Substrates Using Norman Tool &#x201c;WA-1010 Wet Abrader&#x201d;
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM F1049-00
Title: Standard Practice for Shallow Etch Pit Detection on Silicon Wafers
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM E3022-15
Title: Standard Practice for Measurement of Emission Characteristics and Requirements for LED UV-A Lamps Used in Fluorescent Penetrant and Magnetic Particle Testing
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM E1686-10e1
Title: Standard Guide for Applying Environmental Noise Measurement Methods and Criteria
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F1364-03(2015)
Title: Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM F375-89(2015)
Title: Standard Specification for Integrated Circuit Lead Frame Material
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM B896-10(2015)
Title: Standard Test Methods for Evaluating Connectability Characteristics of Electrical Conductor Materials
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM B49-15a
Title: Standard Specification for Copper Rod for Electrical Purposes
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM F1541-02(2015)
Title: Standard Specification and Test Methods for External Skeletal Fixation Devices
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM E1855-15
Title: Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM B682-01(2009)e1
Title: Standard Specification for Standard Metric Sizes of Electrical Conductors
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM B679-98(2015)
Title: Standard Specification for Electrodeposited Coatings of Palladium for Engineering Use
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM F1152-02
Title: Standard Test Method for Dimensions of Notches on Silicon Wafers (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM E1606-15
Title: Standard Practice for Electromagnetic (Eddy Current) Examination of Copper and Aluminum Redraw Rod for Electrical Purposes
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM F1174-01
Title: Standard Practice for Using a Personal Computer Printer as a Test Instrument
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM E1362-15
Title: Standard Test Methods for Calibration of Non-Concentrator Photovoltaic Non-Primary Reference Cells
Organization: ASTM International
Year: 2015
Status: Inactive
ASTM F1188-00
Title: Standard Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F1190-99
Title: Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1192-00
Title: Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F1211-89(2001)
Title: Standard Specification for Semiconductor Device Passivation Opening Layouts (Withdrawn 2007)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F1212-89(2002)
Title: Standard Test Method for Thermal Stability Testing of Gallium Arsenide Wafers (Withdrawn 2008)
Organization: ASTM International
Year: 1989
Status: Inactive
ASTM D4956-16
Title: Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1221-89(2001)
Title: Standard Guide for Interagency Information Exchange
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM D5138-16
Title: Standard Classification System and Basis for Specification for Liquid Crystal Polymers Molding and Extrusion Materials (LCP)
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1238-95(1999)
Title: Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1239-02
Title: Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1241-95(2000)
Title: Standard Terminology of Silicon Technology (Withdrawn 2003)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM B193-16
Title: Standard Test Method for Resistivity of Electrical Conductor Materials
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM E2567-16
Title: Standard Test Method for Determining Nodularity And Nodule Count In Ductile Iron Using Image Analysis
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM E2567-16a
Title: Standard Test Method for Determining Nodularity And Nodule Count In Ductile Iron Using Image Analysis
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1259-89
Title: Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration
Organization: ASTM International
Year: 1988
Status: Inactive
ASTM F1260-89
Title: Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations
Organization: ASTM International
Year: 1988
Status: Inactive
ASTM F1261M-96
Title: Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric]
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM F1263-99
Title: Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM D4956-16a
Title: Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1264-01
Title: Standard Specification and Test Methods for Intramedullary Fixation Devices
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM B576-94(2016)
Title: Standard Guide for Arc Erosion Testing of Electrical Contact Materials
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F76-08(2016)
Title: Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1709-97(2016)
Title: Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
Organization: ASTM International
Year: 2016
Status: Active
ASTM F1844-97(2016)
Title: Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
Organization: ASTM International
Year: 2016
Status: Active
ASTM F1845-08(2016)
Title: Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer
Organization: ASTM International
Year: 2016
Status: Active
ASTM F1896-16
Title: Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
Organization: ASTM International
Year: 2016
Status: Active
ASTM F3152-16
Title: Standard Test Method for Determining Abrasion Resistance of Inks and Coatings on Substrates Using Dry or Wet Abrasive Medium
Organization: ASTM International
Year: 2016
Status: Active
ASTM F744M-16
Title: Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
Organization: ASTM International
Year: 2016
Status: Active
ASTM B49-16
Title: Standard Specification for Copper Rod for Electrical Purposes
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM E1245-03(2016)
Title: Standard Practice for Determining the Inclusion or Second-Phase Constituent Content of Metals by Automatic Image Analysis
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1711-96(2016)
Title: Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe Method
Organization: ASTM International
Year: 2016
Status: Active
ASTM F773M-16
Title: Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)
Organization: ASTM International
Year: 2016
Status: Active
ASTM E1796-03(2016)
Title: Standard Guide for Selection and Use of Liquid Coating Encapsulation Products for Leaded Paint in Buildings
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1264-16
Title: Standard Specification and Test Methods for Intramedullary Fixation Devices
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM C863-00(2016)
Title: Standard Test Method for Evaluating Oxidation Resistance of Silicon Carbide Refractories at Elevated Temperatures
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM B187/B187M-16
Title: Standard Specification for Copper, Bus Bar, Rod, and Shapes and General Purpose Rod, Bar, and Shapes
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM E431-96(2016)
Title: Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1320-01
Title: Standard Test Method for Evaluating Thermal Paper Employing a Facsimile Thermal Printer as a Test Instrument
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F1351-96
Title: Standard Practice for Determination of the Effect of Hard Creasing Paper on Images Produced by Business Imaging Systems
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM E2007-10(2016)
Title: Standard Guide for Computed Radiography
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM D4956-16b
Title: Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1364-92(1997)e1
Title: Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F1367-98
Title: Standard Specification for Chromium Sputtering Targets for Thin Film Applications
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM B354-16
Title: Standard Terminology Relating to Uninsulated Metallic Electrical Conductors
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1388-92(2000)
Title: Standard Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors (Withdrawn 2003)
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1389-00
Title: Standard Test Methods for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities (Withdrawn 2003)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F1390-97
Title: Standard Test Method for Measuring Warp on Silicon Wafers by Automated Noncontact Scanning
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F1391-93(2000)
Title: Standard Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption (Withdrawn 2003)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F1392-00
Title: Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F1393-92(1997)
Title: Standard Test Method for Determining Net Carrier Density in Silicon Wafers by Miller Feedback Profiler Measurements With a Mercury Probe
Organization: ASTM International
Year: 1991
Status: Inactive
ASTM B682-01(2016)
Title: Standard Specification for Standard Metric Sizes of Electrical Conductors
Organization: ASTM International
Year: 2016
Status: Active
ASTM E1686-16
Title: Standard Guide for Applying Environmental Noise Measurement Methods and Criteria
Organization: ASTM International
Year: 2016
Status: Active
ASTM B1004-16
Title: Standard Practice for Contact Performance Classification of Electrical Connection Systems
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM C159-06(2016)
Title: Standard Specification for Vitrified Clay Filter Blocks
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1443-93(1998)
Title: Standard Practice for Using 0.008-in. (0.203-mm) Aperture Reflectometers as Test Instruments for Measuring Visual Image Quality of Business Copy Images
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F1451-92(1999)
Title: Standard Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F1454-99
Title: Standard Practice for Comparing Correctable Film Ribbons
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM E1332-16
Title: Standard Classification for Rating Outdoor-Indoor Sound Attenuation
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1467-99
Title: Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM D6285-99(2016)
Title: Standard Guide for Locating Abandoned Wells
Organization: ASTM International
Year: 2016
Status: Active
ASTM B267-90(2001)
Title: Standard Specification for Wire for Use In Wire-Wound Resistors
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM C1674-16
Title: Standard Test Method for Flexural Strength of Advanced Ceramics with Engineered Porosity (Honeycomb Cellular Channels) at Ambient Temperatures
Organization: ASTM International
Year: 2016
Status: Inactive
ASTM F1264-16e1
Title: Standard Specification and Test Methods for Intramedullary Fixation Devices
Organization: ASTM International
Year: 2016
Status: Active
ASTM F980-16
Title: Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Organization: ASTM International
Year: 2016
Status: Active
ASTM C423-17
Title: Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM F1512-94(1999)
Title: Standard Practice for Ultrasonic C-Scan Bond Evaluation of Sputtering Target-Backing Plate Assemblies
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1513-99
Title: Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1526-95(2000)
Title: Standard Test Method for Measuring Surface Metal Contamination on Silicon Wafers by Total Reflection X-Ray Fluorescence Spectroscopy (Withdrawn 2003)
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1527-00
Title: Standard Guide for Application of Silicon Standard Reference Materials and Reference Wafers for Calibration and Control of Instruments for Measuring Resistivity of Silicon
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM E1795-17
Title: Standard Specification for Non-Reinforced Liquid Coating Encapsulation Products for Leaded Paint in Buildings
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM F1528-94(1999)
Title: Standard Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry (Withdrawn 2003)
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1529-97
Title: Standard Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure (Withdrawn 2003)
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F1530-94
Title: Standard Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Noncontact Scanning
Organization: ASTM International
Year: 1993
Status: Inactive
ASTM F1535-00
Title: Standard Test Method for Carrier Recombination Lifetime in Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance (Withdrawn 2003)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM B888/B888M-17
Title: Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM B615-79(2017)
Title: Standard Practice for Measuring Electrical Contact Noise in Sliding Electrical Contacts
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM F1562-95(1999)
Title: Standard Guide for Use-Oriented Foreign Language Instruction
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM B49-17
Title: Standard Specification for Copper Rod for Electrical Purposes
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM F1569-94(1999)
Title: Standard Guide for Generation of Consensus Reference Materials for Semiconductor Technology (Withdrawn 2003)
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1570-01e1
Title: Standard Test Method for Determining the Tactile Ratio of a Membrane Switch (Withdrawn 2007)
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F76-08(2016)e1
Title: Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Organization: ASTM International
Year: 2016
Status: Active
ASTM F1578-01
Title: Standard Practice for Contact Closure Cycling of a Membrane Switch
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F3080-17
Title: Standard Practice for Laser Technologies for Measurement of Cross-Sectional Shape of Pipeline and Conduit by Non-Rotating Laser Projector and CCTV Camera System
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM F3095-17
Title: Standard Practice for Laser Technologies for Direct Measurement of Cross Sectional Shape of Pipeline and Conduit by Rotating Laser Diodes and CCTV Camera System
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM F18-12(2017)
Title: Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM F29-97(2017)
Title: Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM E986-04(2017)
Title: Standard Practice for Scanning Electron Microscope Beam Size Characterization
Organization: ASTM International
Year: 2017
Status: Active
ASTM F1595-00
Title: Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F1596-00
Title: Standard Practice for Exposure of Membrane Switches to Temperature and Relative Humidity
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F1598-95(2002)
Title: Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method)
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM F1618-96
Title: Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM F1619-95(2000)e1
Title: Standard Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with <i>p</i>-Polarized Radiation Incident at the Brewster Angle (Withdrawn...
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM F1620-96
Title: Standard Practice for Calibrating a Scanning Surface Inspection System Using Monodisperse Polystyrene Latex Spheres Deposited on Polished or Epitaxial Wafer Surfaces (Withdrawn 2003)
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM F1621-96
Title: Standard Practice for Determining the Positional Accuracy Capabilities of a Scanning Surface Inspection System (Withdrawn 2003)
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM F1630-00
Title: Standard Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities (Withdrawn 2003)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM C1730-17
Title: Standard Test Method for Particle Size Distribution of Advanced Ceramics by X-Ray Monitoring of Gravity Sedimentation
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM F1657-96
Title: Standard Practice for Emergency Joining of Booms with Incompatible Connectors
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM F3259-17
Title: Standard Guide for Micro-computed Tomography of Tissue Engineered Scaffolds
Organization: ASTM International
Year: 2017
Status: Active
ASTM F1541-17
Title: Standard Specification and Test Methods for External Skeletal Fixation Devices
Organization: ASTM International
Year: 2017
Status: Active
ASTM D4956-17
Title: Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM E1303-95(2017)
Title: Standard Practice for Refractive Index Detectors Used in Liquid Chromatography
Organization: ASTM International
Year: 2017
Status: Active
ASTM D8023-17
Title: Standard Specification for Round Wood Dowels (Pegs) for Use in Wood Construction
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM E1797-12(2017)e1
Title: Standard Specification for Reinforced Liquid Coating Encapsulation Products for Leaded Paint in Buildings
Organization: ASTM International
Year: 2017
Status: Active
ASTM E2301-12(2017)
Title: Standard Test Method for Daytime Colorimetric Properties of Fluorescent Retroreflective Sheeting and Marking Materials for High Visibility Traffic Control and Personal Safety Applications Using...
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM F3291-17
Title: Standard Test Method for Measuring the Force-Resistance of a Membrane Force Sensor
Organization: ASTM International
Year: 2017
Status: Active
ASTM F3290-17
Title: Standard Guide for Handling and Application of a Membrane Switch or Printed Electronic Device to its Final Support Structure
Organization: ASTM International
Year: 2017
Status: Active
ASTM F3080-17a
Title: Standard Practice for Laser Technologies for Measurement of Cross-Sectional Shape of Pipeline and Conduit by Non-Rotating Laser Projector and CCTV Camera System
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM F3095-17a
Title: Standard Practice for Laser Technologies for Direct Measurement of Cross Sectional Shape of Pipeline and Conduit by Rotating Laser Diodes and CCTV Camera System
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM E2736-17
Title: Standard Guide for Digital Detector Array Radiography
Organization: ASTM International
Year: 2017
Status: Inactive
ASTM F1190-18
Title: Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Organization: ASTM International
Year: 2018
Status: Active
ASTM F83-71(2018)
Title: Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
Organization: ASTM International
Year: 2018
Status: Active
ASTM F85-76(2018)
Title: Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
Organization: ASTM International
Year: 2018
Status: Active
ASTM F996-11(2018)
Title: Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current...
Organization: ASTM International
Year: 2018
Status: Active
ASTM F1192-11(2018)
Title: Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Organization: ASTM International
Year: 2018
Status: Active
ASTM F1892-12(2018)
Title: Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Organization: ASTM International
Year: 2018
Status: Active
ASTM B267-07(2018)
Title: Standard Specification for Wire for Use In Wire-Wound Resistors
Organization: ASTM International
Year: 2018
Status: Active
ASTM F448-18
Title: Standard Test Method for Measuring Steady-State Primary Photocurrent
Organization: ASTM International
Year: 2018
Status: Active
ASTM F1467-18
Title: Standard Guide for Use of an X-Ray Tester (&#x2248;10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Organization: ASTM International
Year: 2018
Status: Active
ASTM F1893-18
Title: Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
Organization: ASTM International
Year: 2018
Status: Active
ASTM E2444-11(2018)
Title: Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films
Organization: ASTM International
Year: 2018
Status: Active
EN 60255-121
Title: Measuring relays and protection equipment - Part 121: Functional requirements for distance protection
Organization: CENELEC
Year: 2014
Status: Active
DIN EN 62880-1
Title: Semiconductor devices - Wafer level reliability for semiconductor devices - Part 1: Copper stress migration test method (IEC 47/2191/CD:2014)
Organization: DIN
Year: 2014
Status: Inactive
DIN EN 60749-44
Title: Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 47/2193/CD:2014)
Organization: DIN
Year: 2014
Status: Inactive
DIN EN 62880-1
Title: Semiconductor devices - Wafer level reliability for semiconductor devices - Part 1: Copper stress migration test method (IEC 47/2191/CD:2014)
Organization: DIN
Year: 2014
Status: Inactive
DIN EN 61189-3-913
Title: Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 3-913: Test method for thermal conductivity of electronic circuit board for high-bri...
Organization: DIN
Year: 2014
Status: Inactive
EN 60871-4
Title: Shunt capacitors for AC power systems having a rated voltage above 1 000 V - Part 4: Internal fuses
Organization: CENELEC
Year: 2014
Status: Active
EN 60255-26
Title: Measuring relays and protection equipment - Part 26: Electromagnetic compatibility requirements
Organization: CENELEC
Year: 2009
Status: Active
NF EN 60938-2-1
Title: Fixed inductors for electromagnetic interference suppression - Part 2-1 : blank detail specification - Inductors for which safety tests are required - Assessment level D
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60255-27
Title: Measuring relays and protection equipment - Part 27 : product safety requirements
Organization: AFNOR
Year: 2014
Status: Active
XP C61-551
Title: Illuminated and non-illuminated sign and signage
Organization: AFNOR
Year: 2014
Status: Active
NF EN 175201-804
Title: DActail specification : circular connectors - Round contacts, size diameter 1,6 mm, threaded coupling
Organization: AFNOR
Year: 2014
Status: Active
NF EN 61587-5
Title: Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 - Part 5 : seismic tests for chassis, subracks, and plug-in units
Organization: AFNOR
Year: 2014
Status: Active
UNE-EN 60061-1/A50
Title: Lamp caps and holders together with gauges for the control of interchangeability and safety - Part 1: Lamp caps
Organization: AENOR
Year: 2014
Status: Active
UNE-EN 60061-2/A47
Title: Lamp caps and holders together with gauges for the control of interchangeability and safety - Part 2: Lampholders
Organization: AENOR
Year: 2014
Status: Active
UNE-EN 60061-3/A48
Title: Lamp caps and holders together with gauges for the control of interchangeability and safety - Part 3: Gauges
Organization: AENOR
Year: 2014
Status: Active
14/30311367 DC
Title: Draft BS EN 62629-22-1 : 3D display devices Part 22-1: Measuring methods for autostereoscopic displays - Optical
Organization: BSI
Year: 2014
Status: Pending
EN 140101-806
Title: Detail Specification: Fixed low power film resistors - Metal film resistors on high grade ceramic, conformal coated or molded, axial or preformed leads
Organization: CENELEC
Year: 2008
Status: Active
EN 62522
Title: Calibration of tuneable laser sources
Organization: CENELEC
Year: 2014
Status: Active
EN 60871-1
Title: Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V - Part 1: General
Organization: CENELEC
Year: 2014
Status: Active
DIN EN 61189-3-913
Title: Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 3-913: Test method for thermal conductivity of electronic circuit board for high-bri...
Organization: DIN
Year: 2014
Status: Inactive
DIN EN 62830-3
Title: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting (IEC 47/2198/CD:2014)
Organization: DIN
Year: 2014
Status: Inactive
DIN EN 62830-3
Title: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting (IEC 47/2198/CD:2014)
Organization: DIN
Year: 2014
Status: Inactive
14/30312971 DC
Title: Draft BS EN 62341-6-3 Organic light emitting diode (OLED) displays Part 6-3: Measuring methods of image quality
Organization: BSI
Year: 2014
Status: Pending
EN 61076-2-109
Title: Connectors for electronic equipment - Product requirements - Part 2-109: Circular connectors - Detail specification for connectors with M 12 x 1 screw-locking, for data transmission frequencies up ...
Organization: CENELEC
Year: 2014
Status: Active
14/30313209 DC
Title: Draft BS EN 62341-6-1 Organic light emitting diode (OLED) displays Part 6-1: Measuring methods of optical and electro-optical parameters
Organization: BSI
Year: 2014
Status: Pending
DIN EN 140402-801
Title: Detail specification: Fixed low power wirewound surface mount (SMD) resistors - Rectangular - Stability classes 0,5; 1; 2; German version FprEN 140402-801:2014
Organization: DIN
Year: 2014
Status: Inactive
DIN EN 62610-5
Title: Mechanical structures for electronic equipment - Thermal management for cabinets in accordance with IEC 60297 and IEC 60917 series - Part 5: Guideline of cooling performance evaluation for indoor c...
Organization: DIN
Year: 2014
Status: Inactive
DIN EN 61189-5-1
Title: Test methods for electrical materials, Interconnection structures and assemblies - Part 5-1: Test methods for printed board assemblies and materials used in manufacturing electronic assemblies - Gu...
Organization: DIN
Year: 2014
Status: Inactive
DSF/EN 60630/FprA7/FprAA
Title: Maximum lamp outlines for incandescent lamps
Organization: DS
Status: Pending
UNE-EN 62384/A1
Title: DC or AC supplied electronic control gear for LED modules - Performance requirements
Organization: AENOR
Year: 2010
Status: Inactive
UNE-EN 61938
Title: Multimedia systems - Guide to the recommended characteristics of analogue interfaces to achieve interoperability
Organization: AENOR
Year: 2014
Status: Inactive
NF EN 50625-1
Title: Collection, logistic and treatment requirements for WEEE - Part 1 : general treatment requirements
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60255-127
Title: Measuring relays and protection equipment - Part 127 : functional requirements for over/under voltage protection
Organization: AFNOR
Year: 2014
Status: Active
EN 62047-21
Title: Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Organization: CENELEC
Year: 2014
Status: Active
EN 62047-20
Title: Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
Organization: CENELEC
Year: 2014
Status: Active
DSF/EN 60901/FPRA6
Title: Single-capped fluorescent lamps - Performance specifications
Organization: DS
Status: Pending
14/30314465 DC
Title: Draft BS EN 62956 Ed 1.0 Hybrid electric double layer capacitors for use in electric and electronic equipment - Test methods for electrical characteristics
Organization: BSI
Year: 2014
Status: Pending
EN 60749-42
Title: Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Organization: CENELEC
Year: 2014
Status: Active
DS/EN 62442-3
Title: Energy performance of lamp controlgear - Part 3: Controlgear for halogen lamps and LED modules - Method of measurement to determine the efficiency of the controlgear
Organization: DS
Year: 2014
Status: Inactive
NF EN 140101-806/A1
Title: Detail Specification : fixed low power film resistors - Metal film resistors on high grade ceramic, conformal coated or molded, axial or preformed leads
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60191-4
Title: Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages
Organization: AFNOR
Year: 2014
Status: Active
NF EN 140200
Title: Sectional specification : fixed power resistors
Organization: AFNOR
Year: 2014
Status: Active
NF EN 123100
Title: Sectional Specifications : single and double-sided printed boards with plain holes
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60061-2/A47
Title: Lamp caps and holders together with gauges for the control of interchangeability and safety - Part 2 : lampholders
Organization: AFNOR
Year: 2014
Status: Active
NF EN 140201
Title: Blank detail specification : fixed power resistors (Assessment level S)
Organization: AFNOR
Year: 2014
Status: Active
NF EN 134104
Title: Blank detail specification : compression type trimmer capacitors (Qualification approval)
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60831-2
Title: Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 1 000 V - Part 2 : ageing test, self-healing test and destruction test
Organization: AFNOR
Year: 2014
Status: Active
NF EN 123400
Title: Sectional specification : flexible printed boards without through connections
Organization: AFNOR
Year: 2014
Status: Active
NF EN 140401-802/A2
Title: Detail specification : fixed low power film SMD resistors - Rectangular - Stability classes 1;2
Organization: AFNOR
Year: 2014
Status: Active
NF EN 134102
Title: Blank detail specification : multi turn concentric capacitors (Qualification approval)
Organization: AFNOR
Year: 2014
Status: Active
NF EN 140401-801/A1
Title: Detail specification : fixed low power film SMD resistors - Rectangular - Stability classes 0,1;0,25;0,5;1
Organization: AFNOR
Year: 2014
Status: Active
NF EN 130101
Title: Blank detail specification : fixed polyethylene-terphtalate film dielectric metal foil capacitors for direct current - Assessment level E
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60061-3/A48
Title: Lamp caps and holders together with gauges for the control of interchangeability and safety - Part 3 : gauges
Organization: AFNOR
Year: 2014
Status: Active
NF EN 112000
Title: Generic specification : image converter and image intensifier tubes
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60831-1
Title: Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 1 000 V - Part 1 : general - Performance, testing and rating - Safety requirements - Guid...
Organization: AFNOR
Year: 2014
Status: Active
NF EN 62442-2
Title: Energy performance of lamp controlgear - Part 2 : controlgear for high intensity discharge lamps (excluding fluorescent lamps) - Method of measurement to determine the efficiency of controlgear
Organization: AFNOR
Year: 2014
Status: Active
NF EN 62707-1
Title: LED-binning - Part 1 : general requirements and white colour grid
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60927/A1
Title: Auxiliaries for lamps - Starting devices (other than glow starters) - Performance requirements
Organization: AFNOR
Year: 2014
Status: Active
NF EN 140401-804/A1
Title: Detail Specification : fixed low power film high stability SMD resistors - Rectangular - Stability classes 0,1;0,25
Organization: AFNOR
Year: 2014
Status: Active
NF EN 123300
Title: Sectional specification : multilayer printed boards
Organization: AFNOR
Year: 2014
Status: Active
NF EN 134103
Title: Blank detail specification : vane type air dielectric capacitor (Qualification approval)
Organization: AFNOR
Year: 2014
Status: Active
NF EN 123500
Title: Sectional specification : flexible printed boards with through connections
Organization: AFNOR
Year: 2014
Status: Active
NF EN 123800
Title: Sectional specification : flexible multilayer printed boards with through connections
Organization: AFNOR
Year: 2014
Status: Active
NF EN 130100
Title: Sectional specification : fixed polyethylene-terephtalae film dielectric metal foil capacitors for direct current
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60358-3
Title: Coupling capacitors and capacitor dividers - Part 3 : AC or DC coupling capacitor for harmonic-filters applications
Organization: AFNOR
Year: 2014
Status: Active
NF EN 134101
Title: Blank detail specification : single turn disc trimmer capacitors (Qualification approval)
Organization: AFNOR
Year: 2014
Status: Active
NF EN 61788-5
Title: Superconductivity - Part 5 : matrix to superconductor volume ratio measurement - Copper to superconductor volume ratio of Cu/Nb-Ti composite superconducting wires
Organization: AFNOR
Year: 2014
Status: Active
CWA 16374-46
Title: Extensions for Financial Services (XFS) interface specification - Release 3.20 - Part 46 : XFS MIB Device Specific Definitions Barcode Reader Device Class MIB 3.20
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60061-1/A50
Title: Lamp caps and holders together with gauges for the control of interchangeability and safety - Part 1 : lamp caps
Organization: AFNOR
Year: 2014
Status: Active
NF EN 140200/A1
Title: Sectional specification : fixed power resistors
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60871-4
Title: Shunt capacitors for AC power systems having a rated voltage above 1 000 V - Part 4 : internal fuses
Organization: AFNOR
Year: 2014
Status: Active
CWA 16374-44
Title: Extensions for Financial Services (XFS) interface specification - Release 3.20 - Part 44 : XFS MIB Application Management MIB 3.20
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60825-1
Title: Safety of laser products - Part 1 : equipment classification and requirements
Organization: AFNOR
Year: 2014
Status: Active
NF EN 61347-2-1/A2
Title: Lamp controlgear - Part 2-1 : particular requirements for starting devices (other than glow starters)
Organization: AFNOR
Year: 2014
Status: Active
NF EN 175300
Title: Sectional specification : rectangular connectors for frequencies below 3 MHz
Organization: AFNOR
Year: 2014
Status: Active
NF EN 123400/A2
Title: Sectional specification : flexible printed boards without through connections
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60749-26
Title: Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Organization: AFNOR
Year: 2014
Status: Active
CWA 16374-32
Title: Extensions for Financial Services (XFS) interface specification - Release 3.20 - Part 32 : XFS MIB Device Specific Definitions Cash Dispenser Device Class MIB 3.20
Organization: AFNOR
Year: 2014
Status: Active
NF EN 123300/A1
Title: Sectional specification : multilayer printed boards
Organization: AFNOR
Year: 2014
Status: Active
NF EN 60255-149
Title: Measuring relays and protection equipment - Part 149 : functional requirements for thermal electrical relays
Organization: AFNOR
Year: 2014
Status: Active
CWA 16374-39
Title: Extensions for Financial Services (XFS) interface specification - Release 3.20 - Part 39 : XFS MIB Device Specific Definitions Alarm Device Class MIB 3.20
Organization: AFNOR
Year: 2014
Status: Active
CWA 16374-38
Title: Extensions for Financial Services (XFS) interface specification - Release 3.20 - Part 38 : XFS MIB Device Specific Definitions Camera Device Class MIB 3.20
Organization: AFNOR
Year: 2014
Status: Active
NF EN 123500/A2
Title: Sectional specification : flexible printed boards with through connections
Organization: AFNOR
Year: 2014
Status: Active
CWA 16374-29
Title: Extensions for Financial Services (XFS) interface specification - Release 3.20 - Part 29 : XFS MIB Architecture and SNMP Extensions MIB 3.20
Organization: AFNOR
Year: 2014
Status: Active
NF EN 62522
Title: Calibration of tuneable laser sources
Organization: AFNOR
Year: 2014
Status: Active
DSF/EN 62532/FPRA1
Title: Fluorescent induction lamps - Safety specifications
Organization: DS
Status: Pending
DIN EN 62899-2-1
Title: Printed electronics - Materials - Part 2-1: Conductive Material Ink (IEC 119/49A/CD:2014)
Organization: DIN
Year: 2014
Status: Inactive
DIN EN 62899-1
Title: Printed electronics - Materials - Part 1: Substrates (IEC 119/48/CD:2014)
Organization: DIN
Year: 2014
Status: Inactive
DIN EN 62565-3-1
Title: Nanomanufacturing - Material specifications - Part 3-1: Graphene - Blank detail specification for electrotechnical applications (IEC 113/217/CD:2014)
Organization: DIN
Year: 2014
Status: Pending
DIN EN 62899-1
Title: Printed electronics - Materials - Part 1: Substrates (IEC 119/48/CD:2014)
Organization: DIN
Year: 2014
Status: Inactive
DIN EN 62565-3-1
Title: Nanomanufacturing - Material specifications - Part 3-1: Graphene - Blank detail specification for electrotechnical applications (IEC 113/217/CD:2014)
Organization: DIN
Year: 2014
Status: Pending
DIN IEC/TS 62607-4-3
Title: Nanomanufacturing - Key control characteristics - Part 4-3: Nano-enabled electrical energy storage - Contact and coating resistivity measurements for nanomaterials (IEC 113/213/CD:2014)
Organization: DIN
Year: 2014
Status: Inactive
DIN EN 62899-2-1
Title: Printed electronics - Materials - Part 2-1: Conductive Material Ink (IEC 119/49A/CD:2014)
Organization: DIN
Year: 2014
Status: Inactive
UNE-EN 61547
Title: Equipment for general lighting purposes - EMC immunity requirements
Organization: AENOR
Year: 2011
Status: Active
UNE-EN 62707-1
Title: LED-binning - Part 1: General requirements and white colour grid
Organization: AENOR
Year: 2014
Status: Active
EN ISO 11990-2
Title: Lasers and laser-related equipment - Determination of laser resistance of tracheal tubes - Part 2: Tracheal tube cuffs
Organization: CEN
Year: 2014
Status: Inactive
EN 61883-6
Title: Consumer audio/video equipment - Digital interface - Part 6: Audio and music data transmission protocol
Organization: CENELEC
Year: 2014
Status: Active
EN 61076-2-104
Title: Connectors for electronic equipment - Product requirements - Part 2-104: Circular connectors - Detail specification for circular connectors with M8 screw-locking or snap-locking
Organization: CENELEC
Year: 2014
Status: Active
EN ISO 11990-1
Title: Lasers and laser-related equipment - Determination of laser resistance of tracheal tubes - Part 1: Tracheal tube shaft
Organization: CEN
Year: 2014
Status: Inactive


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