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ASTM D1930-80
Title:
Specification for Kraft Dielectric Tissue, Capacitor Grade (Withdrawn 1985)
Organization: ASTM International
Year: 1979
Status: Inactive
ASTM B576-94(1999)
Title:
Standard Guide for Arc Erosion Testing of Electrical Contact Materials
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM B615-79(2000)
Title:
Standard Practice for Measuring Electrical Contact Noise in Sliding Electrical Contacts
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM E1144-87
Title:
Method for Calibration of Non-Concentrator Terrestrial Photovoltaic Primary Reference Cells Under Direct Irradiance (Withdrawn 1992)
Organization: ASTM International
Year: 1986
Status: Inactive
ASTM F35-68(1988)
Title:
Practice for Identification of Minute Crystalline Particle Contaminants by X-Ray Diffraction (Withdrawn 1994)
Organization: ASTM International
Status: Inactive
ASTM F40-83
Title:
Method for Preparing Monocrystalline Test Ingots of Silicon by the Vertical-Pulling (Czochralski) Technique (Withdrawn 1988)
Organization: ASTM International
Year: 1982
Status: Inactive
ASTM F41-90
Title:
Practice for Preparing Silicon Single Crystals by the Floating-Zone Technique for Evaluation of Polysilicon Ingot (Withdrawn 1996)
Organization: ASTM International
Year: 1989
Status: Inactive
ASTM F59-68(1988)
Title:
Method for Identification of Metal Particulate Contamination Found in Electronic and Microelectronic Components and Systems Using the Ring Oven Technique, With Spot Tests (Withdrawn 1994)
Organization: ASTM International
Status: Inactive
ASTM F60-68(1983)
Title:
Methods for Detection and Enumeration of Microbiological Contaminants in Water Used for Processing Electron and Microelectronic Devices (Withdrawn 1991)
Organization: ASTM International
Status: Inactive
ASTM F74-73(1989)
Title:
Practice for Determining Hydrolytic Stability of Plastic Encapsulants for Electronic Devices (Withdrawn 1994)
Organization: ASTM International
Year: 1972
Status: Inactive
ASTM F108-88
Title:
Test Method for Resistivity of Silicon Epitaxial Layers by the Three-Probe Voltage Breakdown Method
Organization: ASTM International
Year: 1987
Status: Inactive
ASTM F120-88
Title:
Practices for Determination of the Concentration of Impurities in Single Crystal Semiconductor Materials by Infrared Absorption Spectroscopy (Withdrawn 1993)
Organization: ASTM International
Year: 1987
Status: Inactive
ASTM F121-83
Title:
Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption
Organization: ASTM International
Year: 1982
Status: Inactive
ASTM F122-74(1985)
Title:
Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption (Withdrawn 1990)
Organization: ASTM International
Year: 1973
Status: Inactive
ASTM F123-91
Title:
Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption (Withdrawn 1992)
Organization: ASTM International
Year: 1990
Status: Inactive
ASTM F127-84
Title:
Definitions of Terms Relating to Relating to Photomasking Technology for Microelectronics (Withdrawn 1992)
Organization: ASTM International
Year: 1983
Status: Inactive
ASTM F128-66(1983)
Title:
Methods of Testing Sleeves and Tubing for Electron Tube Cathodes (Withdrawn 1991)
Organization: ASTM International
Status: Inactive
ASTM F239-81(1987)
Title:
Specification for Nickel Alloy Cathode Sleeves for Electron Devices (Withdrawn 1992)
Organization: ASTM International
Year: 1980
Status: Inactive
ASTM F300-64(1987)
Title:
Methods of Measuring Interface Impedance Characteristics of Electron Tube Cathodes
Organization: ASTM International
Status: Inactive
ASTM F316-03
Title:
Standard Test Methods for Pore Size Characteristics of Membrane Filters by Bubble Point and Mean Flow Pore Test
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM F379-76(1987)
Title:
Recommended Practice for Measuring Slope Efficiency and Lasing Threshold of Ruby Laser Rods
Organization: ASTM International
Year: 1975
Status: Inactive
ASTM F380-77(1989)
Title:
Test Method for Effective Fluorescent Lifetime of Neodymium-Doped Laser Materials (Withdrawn 1994)
Organization: ASTM International
Year: 1976
Status: Inactive
ASTM F388-84
Title:
Method for Measurement of Oxide Thickness on Silicon Wafers and Metallization Thickness by Multiple-Beam Interference (Tolansky Method) (Withdrawn 1993)
Organization: ASTM International
Year: 1983
Status: Inactive
ASTM F507-77(1989)
Title:
Practice for Mounting Wedged Beamsplitters to Maintain a Laser Beam Parallel to a Reference Surface (Withdrawn 1994)
Organization: ASTM International
Year: 1976
Status: Inactive
ASTM F517-77(1989)
Title:
Practice for Aligning a Visible Beam From a Continuous-Wave Laser at a Desired Distance From a Reference Surface (Withdrawn 1994)
Organization: ASTM International
Year: 1976
Status: Inactive
ASTM F530-81(1987)
Title:
Test Method for Wavefront Distortion of Laser Rods (Withdrawn 1994)
Organization: ASTM International
Year: 1980
Status: Inactive
ASTM F531-81(1987)
Title:
Test Method for Wavefront Distortion and Face Parallelism of Laser Disks (Withdrawn 1994)
Organization: ASTM International
Year: 1980
Status: Inactive
ASTM F570-90
Title:
Test Method for Transistor Collector-Emitter Saturation Voltage (Withdrawn 1995)
Organization: ASTM International
Year: 1989
Status: Inactive
ASTM F578-78(1987)
Title:
Test Method for Lasting Threshold and Slope Efficiency of Neodymium-Doped Laser Rods
Organization: ASTM International
Year: 1977
Status: Inactive
ASTM F579-80(1987)
Title:
Test Method for Face Flatness by Optical Non-Contact Technique
Organization: ASTM International
Year: 1979
Status: Inactive
ASTM F612-88
Title:
Practice for Cleaning Surfaces of Polished Silicon Slices (Withdrawn 1993)
Organization: ASTM International
Year: 1987
Status: Inactive
ASTM F615-79(1988)
Title:
Practice for Determining Safe Current Pulse Operating Regions for Metallization on Semiconductor Components (Withdrawn 1995)
Organization: ASTM International
Year: 1978
Status: Inactive
ASTM F618-79
Title:
Method for Measuring MOSFET Saturated Threshold Voltage
Organization: ASTM International
Year: 1978
Status: Inactive
ASTM F632-90
Title:
Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995)
Organization: ASTM International
Year: 1989
Status: Inactive
ASTM F675-91
Title:
Test Method for Measuring Nonequilibrium Transient Photocurrents in P-N Junctions (Withdrawn 1995)
Organization: ASTM International
Year: 1990
Status: Inactive
ASTM F752-82(1989)
Title:
Test Method for Effective Series Resistance (ESR) and Capitance of Multilayer Ceramic Capacitors at High Frequencies (Withdrawn 1994)
Organization: ASTM International
Year: 1981
Status: Inactive
ASTM F774-82
Title:
Guide for Analysis of Latchup Susceptibility in Bipolar Integrated Circuits (Withdrawn 1987)
Organization: ASTM International
Year: 1981
Status: Inactive
ASTM F775-88
Title:
Test Method for Wafer and Slice Flatness by Interferometric (Withdrawn 1991)
Organization: ASTM International
Year: 1987
Status: Inactive
ASTM F848-83(1988)
Title:
Method for Determining the Lattice Constant of Single Crystal Gadolinium Gallium Garnet (Withdrawn 1992)
Organization: ASTM International
Year: 1982
Status: Inactive
ASTM F849-83(1988)
Title:
Method for Identification and Test of Structures and Contaminants Seen on Polished Gadolinium Gallium Surfaces (Withdrawn 1992)
Organization: ASTM International
Year: 1982
Status: Inactive
ASTM F850-83(1988)
Title:
Test Method for Crystallographic Perfection of Gadolinium Gallium Garnet by Preferential Etch Techniques (Withdrawn 1992)
Organization: ASTM International
Year: 1982
Status: Inactive
ASTM F1032-91
Title:
Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)
Organization: ASTM International
Year: 1990
Status: Inactive
ASTM F1096-87
Title:
Method for Measuring Mosfet Saturated Threshold Voltage (Withdrawn 1992)
Organization: ASTM International
Year: 1986
Status: Inactive
ASTM F1189-88
Title:
Test Method for Using Computer-Assisted Infrared Spectrophotometry to Measure the Interstitial Oxygen Content of Silicon Slices Polished on Both Sides (Withdrawn 1993)
Organization: ASTM International
Year: 1987
Status: Inactive
ASTM F1191-88
Title:
Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993)
Organization: ASTM International
Year: 1987
Status: Inactive
ASTM B682-01
Title:
Standard Specification for Standard Metric Sizes of Electrical Conductors
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F772-82(1990)
Title:
Test Method for Noise Quality of Film-Type Resistors (Withdrawn 1996)
Organization: ASTM International
Year: 1981
Status: Inactive
ASTM F466-79(1992)
Title:
Test Method for Small-Signal Scattering Parameters of Low-Power Transistors in the 0.2 to 2.0 GHZ Frequency Range (Withdrawn 1997)
Organization: ASTM International
Year: 1978
Status: Inactive
ASTM F135-76(1991)
Title:
Test Method for Embedment Stress Caused by Casting Compounds on Glass-Encased Electronic Components (Withdrawn 1997)
Organization: ASTM International
Year: 1975
Status: Inactive
ASTM F1340-92
Title:
Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)
Organization: ASTM International
Year: 1991
Status: Inactive
ASTM E1916-97
Title:
Standard Guide for Identification and/or Segregation of Mixed Lots of Metals
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F769-00
Title:
Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM B888-98
Title:
Standard Specification for Copper Alloy Strip for Use in the Manufacture of Electrical Connectors or Spring Contacts
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM D6101-97
Title:
Standard Test Method for Equivalent Black Area (EBA) of Dirt in Pulp, Paper and Paperboard by Image Analysis
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM B713-82(1997)e1
Title:
Standard Terminology Relating to Superconductors (Withdrawn 2001)
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM B714-82(1997)e1
Title:
Standard Test Method for D-C Critical Current of Composite Superconductors (Withdrawn 2001)
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM E1919-00
Title:
Standard Guide for Worldwide Published Standards Relating to Particle and Spray Characterization
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM E1942-98e1
Title:
Standard Guide for Evaluating Data Acquisition Systems Used in Cyclic Fatigue and Fracture Mechanics Testing
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1893-98
Title:
Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F1894-98
Title:
Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F1842-97
Title:
Standard Test Method for Determining Ink or Coating Adhesion on Plastic Substrates for Membrane Switch Applications
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F1895-98
Title:
Practice for Submersion of a Membrane Switch
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F1896-98
Title:
Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM B738-98
Title:
Standard Specification for Fine-Wire Bunch-Stranded and Rope-Lay Bunch-Stranded Copper Conductors for Use as Electrical Conductors
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F1892-98
Title:
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM D6285-99
Title:
Standard Guide for Locating Abandoned Wells
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1944-98
Title:
Standard Practice for Determining the Quality of the Text, Line- and Solid-Fill Output Produced by Ink Jet Printers
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F448-99
Title:
Test Method for Measuring Steady-State Primary Photocurrent
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM D6095-99
Title:
Standard Test Method for Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1725-97
Title:
Standard Guide for Analysis of Crystallographic Perfection of Silicon Ingots
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F1726-97
Title:
Standard Guide for Analyis of Crystallographic Perfection of Silicon Wafers
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F1727-97
Title:
Standard Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F1724-01
Title:
Standard Test Method for Measuring Surface Metal Contamination of Polycrystalline Silicon by Acid Extraction-Atomic Absorption Spectroscopy (Withdrawn 2003)
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F773M-96
Title:
Practice for Measuring Dose Rate Response of Linear Integrated Circuits
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM F616M-96
Title:
Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric)
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM F1423-97
Title:
Standard Practice for Determination of the Quality of Monochrome Images Produced from Non-Impact Personal Computer Printers
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM B896-99
Title:
Standard Test Methods for Evaluating Connectability Characteristics of Electrical Conductor Materials
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1809-97
Title:
Standard Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F1982-99e1
Title:
Standard Test Methods for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography (Withdrawn 2003)
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM D6432-99
Title:
Standard Guide for Using the Surface Ground Penetrating Radar Method for Subsurface Investigation
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1995-00
Title:
Standard Test Method for Determining the Bond Strength for a Surface Mount Device (SMD) by Applying Shear Force on a Membrane Switch
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F1997-99
Title:
Standard Test Method for Determining the Sensitivity (Teasing) of a Tactile Membrane Switch
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F2072-01
Title:
Standard Practice for Hosedown of a Membrane Switch
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F2074-00
Title:
Standard Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers (Withdrawn 2003)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F2073-01
Title:
Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F2086-01
Title:
Standard Test Method for Pass Through Flux of Circular Magnetic Sputtering Targets, Method 2 (Withdrawn 2007)
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F2113-01e1
Title:
Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM B868-96
Title:
Standard Practice for Contact Performance Classification of Electrical Connection Systems
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM B869-96
Title:
Standard Specification for Copper-Clad Steel Electrical Conductor for CATV Drop Wire
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM B870-96
Title:
Standard Specification for Copper-Beryllium Alloy Forgings and Extrusions Alloys C17500 and C17510
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM C423-02
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM C159-98
Title:
Standard Specification for Vitrified Clay Filter Blocks
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM B682-81A(1996)E1
Title:
Standard Specification for Standard Metric Sizes of Electrical Conductors
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM B193-01
Title:
Standard Test Method for Resistivity of Electrical Conductor Materials
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM B193-00
Title:
Standard Test Method for Resistivity of Electrical Conductor Materials
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM E1245-95
Title:
Standard Practice for Determining the Inclusion or Second-Phase Constituent Content of Metals by Automatic Image Analysis
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM B539-96
Title:
Standard Test Methods for Measuring Resistance of Electrical Connections (Static Contacts)
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM E1657-98
Title:
Standard Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM E1303-95
Title:
Practice for Refractive Index Detectors Used in Liquid Chromatography
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM D4956-01
Title:
Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM D4956-00
Title:
Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM C423-00
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM C423-99a
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM D5714-95
Title:
Standard Specification for Content of Digital Geospatial Metadata
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM D5933-96
Title:
Standard Specification for 2 5/8-in. and 4-in. Diameter Metal Shear Plates for Use in Wood Constructions
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM B539-02
Title:
Standard Test Methods for Measuring Resistance of Electrical Connections (Static Contacts)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM C423-01
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F1027-86(2002)
Title:
Standard Practice for Assessment of Tissue and Cell Compatibility of Orofacial Prosthetic Materials and Devices
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM D1867-96
Title:
Standard Specification for Copper-Clad Thermosetting Laminates for Printed Wiring
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM D3004-97
Title:
Standard Specification for Extruded Crosslinked and Thermoplastic Semi-Conducting, Conductor and Insulation Shielding Materials
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F2113-01
Title:
Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F1211-89(1994)e1
Title:
Standard Specification for Semiconductor Device Passivation Opening Layouts
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F1190-93
Title:
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F364-96
Title:
Standard Specification for Molybdenum Flattened Wire for Electron Tubes
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM F637-85(1994)e1
Title:
Standard Specification for Format, Physical Properties, and Test Methods for 19 and 35 mm Testable Tape Carrier for Perimeter Tape Carrier-Bonded Semiconductor Devices
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F3-99
Title:
Standard Specification for Nickel Strip for Electron Tubes
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F533-96
Title:
Standard Test Method for Thickness and Thickness Variation of Silicon Wafers
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F576-00
Title:
Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F928-93(1999)
Title:
Standard Test Methods for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F951-01
Title:
Standard Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1724-96
Title:
Standard Test Method for Measuring Surface Metal Contamination of Polycrystalline Silicon by Acid Extraction-Atomic Absorption Spectroscopy
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F1689-96
Title:
Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1597-01
Title:
Standard Test Method for Determining the Actuation Force and Contact Force of a Membrane Switch
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1597-00
Title:
Standard Test Method for Determining the Actuation Force and Contact Force of a Membrane Switch
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F81-00
Title:
Standard Test Method for Measuring Radial Resistivity Variation on Silicon Wafers
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F1578-00
Title:
Standard Practice for Contact Closure Cycling of a Membrane Switch
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F1152-93(2001)
Title:
Standard Test Method for Dimensions of Notches on Silicon Wafers
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F2072-00
Title:
Standard Practice for Hosedown of a Membrane Switch
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F2073-00
Title:
Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F951-96
Title:
Standard Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1762-97
Title:
Standard Practice for Exposing a Membrane Switch to Variation in Atmospheric Pressure
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F534-97
Title:
Standard Test Method for Bow of Silicon Wafers
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F672-88(1995)e1
Title:
Standard Test Method for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F1570-94
Title:
Standard Test Method for Determining the Tactile Ratio of a Membrane Switch
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F1239-94
Title:
Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F978-90(1996)e1
Title:
Standard Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F1264-00
Title:
Standard Specification and Test Methods for Intramedullary Fixation Devices
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM E1458-92
Title:
Standard Test Method for Calibration Verification of Laser Diffraction Particle Sizing Instruments Using Photomask Reticles
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F91-70(1996)
Title:
Standard Practice for Testing for Leaks in the Filters Associated With Laminar Flow Clean Rooms and Clean Work Stations by Use of a Condensation Nuclei Detector
Organization: ASTM International
Year: 1970
Status: Inactive
ASTM E2222-02
Title:
Standard Practice for Host Computer Communication with Spectrometers for Color Measurements
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F360-82(1997)
Title:
Standard Practice for Image Evaluation of Electrostatic Business Copies
Organization: ASTM International
Year: 1982
Status: Inactive
ASTM F1174-91(1995)
Title:
Standard Practice for Using a Personal Computer Printer as a Test Instrument
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F686-94(1996)
Title:
Standard Practice for Evaluation of Image Quality Produced by a Carbonless Copy Paper with an Electric or Electronic Typewriter
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM F505-87(1997)
Title:
Standard Practice for the Comparative Evaluation of the Imaging Properties of Liquid Electrostatic Toners
Organization: ASTM International
Year: 1987
Status: Inactive
ASTM F1320-92(1996)
Title:
Standard Test Method for Evaluating Thermal Paper Employing a Facsimile Thermal Printer as a Test Instrument
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM F1423-97(2002)
Title:
Standard Practice for Determination of the Quality of Monochrome Images Produced from Non-Impact Personal Computer Printers
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F1618-02
Title:
Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM D6767-02
Title:
Standard Test Method for Pore Size Characteristics of Geotextiles by Capillary Flow Test
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1527-02
Title:
Standard Guide for Application of Certified Reference Materials and Reference Wafers for Calibration and Control of Instruments for Measuring Resistivity of Silicon (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM C749-92(2002)
Title:
Standard Test Method for Tensile Stress-Strain of Carbon and Graphite
Organization: ASTM International
Year: 1992
Status: Inactive
ASTM F542-02
Title:
Standard Test Method for Exothermic Temperature of Encapsulating Compounds for Electronic and Microelectronic Encapsulation
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM B187/B187M-02
Title:
Standard Specification for Copper, Bus Bar, Rod, and Shapes and General Purpose Rod, Bar, and Shapes
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F2201-02e1
Title:
Standard Consumer Safety Specification for Utility Lighters
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM C863-00
Title:
Standard Test Method for Evaluating Oxidation Resistance of Silicon Carbide Refractories at Elevated Temperatures
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM E1855-96
Title:
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM E1686-02
Title:
Standard Guide for Selection of Environmental Noise Measurements and Criteria
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM C1060-90(1997)e1
Title:
Standard Practice for Thermographic Inspection of Insulation Installations in Envelope Cavities of Frame Buildings
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM F28-02
Title:
Standard Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F42-02
Title:
Standard Test Methods for Conductivity Type of Extrinsic Semiconducting Materials (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F84-02
Title:
Standard Test Method for Measuring Resistivity of Silicon Wafers With an In-Line Four-Point Probe (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F374-02
Title:
Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure (Withdrawn ...
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F391-02
Title:
Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F397-02
Title:
Standard Test Method for Resistivity of Silicon Bars Using a Two-Point Probe (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F523-02
Title:
Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F533-02a
Title:
Standard Test Method for Thickness and Thickness Variation of Silicon Wafers (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F534-02a
Title:
Standard Test Method for Bow of Silicon Wafers (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F847-02
Title:
Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F950-02
Title:
Standard Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Slice Surface by Angle Polishing and Defect Etching (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1049-02
Title:
Standard Practice for Shallow Etch Pit Detection on Silicon Wafers (Withdrawn 2003
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1393-02
Title:
Standard Test Method for Determining Net Carrier Density in Silicon Wafers by Miller Feedback Profiler Measurements With a Mercury Probe (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1529-02
Title:
Standard Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1725-02
Title:
Standard Guide for Analysis of Crystallographic Perfection of Silicon Ingots (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1726-02
Title:
Standard Guide for Analyis of Crystallographic Perfection of Silicon Wafers (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1727-02
Title:
Standard Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1809-02
Title:
Standard Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1812-02
Title:
Standard Test Method for Determining the Effectiveness of Membrane Switch ESD Shielding
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1842-02
Title:
Standard Test Method for Determining Ink or Coating Adhesion on Plastic Substrates for Membrane Switch Applications
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F2114-02
Title:
Standard Guide for ASTM Standard Test Methods, Standard Practices, and Typical Values of a Membrane Switch (Withdrawn 2009)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F2218-02
Title:
Standard Guide for Hardware Implementation for Computerized Systems
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F3-02a
Title:
Standard Specification for Nickel Strip for Electron Tubes (Withdrawn 2008)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F673-02
Title:
Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F597-83(2003)
Title:
Standard Practice for Evaluation of One-Time Carbon Paper in Carbon-Interleaved Business Forms by Use of an Electric Typewriter
Organization: ASTM International
Year: 1983
Status: Inactive
ASTM F1443-93(2003)
Title:
Standard Practice for Using 0.008-in. (0.203-mm) Aperture Reflectometers as Test Instruments for Measuring Visual Image Quality of Business Copy Images
Organization: ASTM International
Year: 1993
Status: Inactive
ASTM F1392-02
Title:
Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1390-02
Title:
Standard Test Method for Measuring Warp on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1843-97(2002)
Title:
Standard Practice for Sample Preparation of Transparent Plastic Films for Specular Gloss Measurements, on Membrane Switch Overlays
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F398-92(2002)
Title:
Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum (Withdrawn 2003)
Organization: ASTM International
Year: 1992
Status: Inactive
ASTM F1153-92(2002)
Title:
Standard Test Method for Characterization of Metal-Oxide-Silicon (MOS) Structures by Capacitance-Voltage Measurements (Withdrawn 2003)
Organization: ASTM International
Year: 1992
Status: Inactive
ASTM F1188-02
Title:
Standard Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption with Short Baseline (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1366-92(2002)
Title:
Standard Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry (Withdrawn 2003)
Organization: ASTM International
Year: 1991
Status: Inactive
ASTM F1530-02
Title:
Standard Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1771-97(2002)
Title:
Standard Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique (Withdrawn 2003)
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F1810-97(2002)
Title:
Standard Test Method for Counting Preferentially Etched or Decorated Surface Defects in Silicon Wafers (Withdrawn 2003)
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM B539-02e1
Title:
Standard Test Methods for Measuring Resistance of Electrical Connections (Static Contacts)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM E1245-03
Title:
Standard Practice for Determining the Inclusion or Second-Phase Constituent Content of Metals by Automatic Image Analysis
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM C423-02a
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F29-97(2002)
Title:
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM B187/B187M-03
Title:
Standard Specification for Copper, Bus Bar, Rod, and Shapes and General Purpose Rod, Bar, and Shapes
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM F78-97(2002)
Title:
Standard Test Method for Calibration of Helium Leak Detectors by Use of Secondary Standards (Withdrawn 2008)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F85-76(2002)
Title:
Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F357-78(2002)
Title:
Standard Practice for Determining Solderability of Thick Film Conductors (Withdrawn 2008)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F508-77(2002)
Title:
Standard Practice for Specifying Thick-Film Pastes (Withdrawn 2008)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1711-96(2002)
Title:
Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1844-97(2002)
Title:
Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1845-97(2002)
Title:
Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Reduction Glow Discharge Mass Spectrometer
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F798-97(2002)
Title:
Standard Practice for Determining Gettering Rate, Sorption Capacity, and Gas Content of Nonevaporable Getters in the Molecular Flow Region (Withdrawn 2008)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1262M-95(2002)
Title:
Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F1709-97(2002)
Title:
Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM F97-72(2002)e1
Title:
Standard Practices for Determining Hermeticity of Electron Devices by Dye Penetration (Withdrawn 2008)
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM D5933-96(2001)
Title:
Standard Specification for 2 5/8-in. and 4-in. Diameter Metal Shear Plates for Use in Wood Constructions
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM B888-03
Title:
Standard Specification for Copper Alloy Strip for Use in the Manufacture of Electrical Connectors or Spring Contacts
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM D3380-90(2003)
Title:
Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM F1264-03
Title:
Standard Specification and Test Methods for Intramedullary Fixation Devices
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM B885-97(2003)
Title:
Standard Test Method for Presence of Foreign Matter on Printed Wiring Board Contacts
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM F616M-96(2003)
Title:
Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric) (Withdrawn 2009)
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM F980M-96(2003)
Title:
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric]
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM F1260M-96(2003)
Title:
Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric] (Withdrawn 2009)
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM E2301-03
Title:
Standard Test Method for Daytime Colorimetric Properties of Fluorescent Retroreflective Sheeting and Marking Materials for High Visibility Traffic Control and Personal Safety Applications Using 45&...
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM E1854-03
Title:
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM B738-03
Title:
Standard Specification for Fine-Wire Bunch-Stranded and Rope-Lay Bunch-Stranded Copper Conductors for Use as Electrical Conductors
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM E1332-90(2003)
Title:
Standard Classification for Determination of Outdoor-Indoor Transmission Class
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM E1686-03
Title:
Standard Guide for Selection of Environmental Noise Measurements and Criteria
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM E1919-03
Title:
Standard Guide for Worldwide Published Standards Relating to Particle and Spray Characterization
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM E1796-03
Title:
Standard Guide for Selection and Use of Liquid Coating Encapsulation Products for Leaded Paint in Buildings
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM E1797-03
Title:
Standard Specification for Reinforced Liquid Coating Encapsulation Products for Leaded Paint in Buildings
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM D4241-98(2003)
Title:
Standard Practice for Design of Gas Turbine Generator Lubricating Oil Systems (Withdrawn 2008)
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM D4248-98(2003)
Title:
Standard Practice for Design of Steam Turbine Generator Oil Systems (Withdrawn 2008)
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM E1127-03
Title:
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM F1364-03
Title:
Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM F596-82(2003)
Title:
Standard Practice for Comparative Evaluation of the Imaging Properties of Dry Electrostatic Toners
Organization: ASTM International
Year: 1982
Status: Inactive
ASTM F875-94(2003)
Title:
Standard Test Method for Evaluation of Large Area Density and Background on Office Copiers
Organization: ASTM International
Year: 1994
Status: Inactive
ASTM F1454-99(2003)
Title:
Standard Practice for Comparing Correctable Film Ribbons
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1944-98(2003)
Title:
Standard Practice for Determining the Quality of the Text, Line- and Solid-Fill Output Produced by Ink Jet Printers
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F996-98(2003)
Title:
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Volta...
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F1238-95(2003)
Title:
Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1367-98(2003)
Title:
Standard Specification for Chromium Sputtering Targets for Thin Film Applications
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F1512-94(2003)
Title:
Standard Practice for Ultrasonic C-Scan Bond Evaluation of Sputtering Target-Backing Plate Assemblies
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1893-98(2003)
Title:
Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F1894-98(2003)
Title:
Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F1-03
Title:
Standard Specification for Nickel-Clad and Nickel-Plated Steel Strip for Electron Tubes (Withdrawn 2009)
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM F1513-99(2003)
Title:
Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F2357-04
Title:
Standard Test Method for Determining the Abrasion Resistance of Inks and Coatings on Membrane Switches Using the Norman Tool "RCA" Abrader
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F677-04
Title:
Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E1795-04
Title:
Standard Specification for Non-Reinforced Liquid Coating Encapsulation Products for Leaded Paint in Buildings
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E1797-04
Title:
Standard Specification for Reinforced Liquid Coating Encapsulation Products for Leaded Paint in Buildings
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM B49-98(2004)
Title:
Standard Specification for Copper Rod Drawing Stock for Electrical Purposes
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E703-98(2004)e1
Title:
Standard Practice for Electromagnetic (Eddy-Current) Sorting of Nonferrous Metals
Organization: ASTM International
Year: 2003
Status: Inactive
ASTM F2359-04
Title:
Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F2360-04
Title:
Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E1942-98(2004)
Title:
Standard Guide for Evaluating Data Acquisition Systems Used in Cyclic Fatigue and Fracture Mechanics Testing
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F1895-98(2004)
Title:
Practice for Submersion of a Membrane Switch
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F1896-98(2004)
Title:
Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F2411-04
Title:
Standard Specification for Design and Performance of an Airborne Sense-and-Avoid System
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E1916-97(2004)
Title:
Standard Guide for Identification and/or Segregation of Mixed Lots of Metals
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E566-99(2004)e1
Title:
Standard Practice for Electromagnetic (Eddy-Current) Sorting of Ferrous Metals
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E1606-99(2004)e1
Title:
Standard Practice for Electromagnetic (Eddy-Current) Examination of Copper Redraw Rod for Electrical Purposes
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM B888-04
Title:
Standard Specification for Copper Alloy Strip for Use in the Manufacture of Electrical Connectors or Spring Contacts
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E986-04
Title:
Standard Practice for Scanning Electron Microscope Beam Size Characterization
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F1892-04
Title:
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E722-04
Title:
Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E1855-04
Title:
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM D1867-01
Title:
Standard Specification for Copper-Clad Thermosetting Laminates for Printed Wiring
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM D4956-04
Title:
Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM D4496-04
Title:
Standard Test Method for D-C Resistance or Conductance of Moderately Conductive Materials
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F497-00(2004)
Title:
Standard Practice for Use of the Electric and Electronic Typewriter as a Test Instrument
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM D5109-99(2004)
Title:
Standard Test Methods for Copper-Clad Thermosetting Laminates for Printed Wiring Boards
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM E1654-94(2004)
Title:
Standard Guide for Measuring Ionizing Radiation-Induced Spectral Changes in Optical Fibers and Cables for Use in Remote Raman FiberOptic Spectroscopy
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F4-66(2005)
Title:
Standard Specification for Carbonized Nickel Strip and Carbonized Nickel-Plated and Nickel-Clad Steel Strip for Electron Tubes (Withdrawn 2010)
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F375-89(2005)
Title:
Standard Specification for Integrated Circuit Lead Frame Material
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F448-99(2005)
Title:
Test Method for Measuring Steady-State Primary Photocurrent
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F528-99(2005)
Title:
Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn 2011)
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1263-99(2005)
Title:
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1467-99(2005)
Title:
Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F1997-99(2005)
Title:
Standard Test Method for Determining the Sensitivity (Teasing) of a Tactile Membrane Switch
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM E1250-88(2005)
Title:
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F1190-99(2005)
Title:
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM D4196-05
Title:
Standard Test Method for Confirming the Sterility of Membrane Filters
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E722-04e1
Title:
Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E1303-95(2005)
Title:
Practice for Refractive Index Detectors Used in Liquid Chromatography
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM B354-05
Title:
Standard Terminology Relating to Uninsulated Metallic Electrical Conductors
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM D6095-05
Title:
Standard Test Method for Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM D6285-99(2005)
Title:
Standard Guide for Locating Abandoned Wells
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM D7147-05
Title:
Standard Specification for Testing and Establishing Allowable Loads of Joist Hangers
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM F2451-05
Title:
Standard Guide for <i>in vivo</i> Assessment of Implantable Devices Intended to Repair or Regenerate Articular Cartilage
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM E1362-05
Title:
Standard Test Method for Calibration of Non-Concentrator Photovoltaic Secondary Reference Cells
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM D7145-05
Title:
Standard Guide for Measurement of Atmospheric Wind and Turbulence Profiles by Acoustic Means
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM F1689-05
Title:
Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM F1595-00(2005)
Title:
Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM F1596-00(2005)
Title:
Standard Practice for Exposure of Membrane Switches to Temperature and Relative Humidity
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM F1995-00(2005)
Title:
Standard Test Method for Determining the Bond Strength for a Surface Mount Device (SMD) by Applying Shear Force on a Membrane Switch
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM F1761-00(2005)
Title:
Standard Test Method for Pass Through Flux of Circular Magnetic Sputtering Targets
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM E2444-05
Title:
Terminology Relating to Measurements Taken on Thin, Reflecting Films
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM E1854-05
Title:
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM E668-05
Title:
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM F2411-04e1
Title:
Standard Specification for Design and Performance of an Airborne Sense-and-Avoid System
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E1855-04e1
Title:
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM E977-05
Title:
Standard Practice for Thermoelectric Sorting of Electrically Conductive Materials
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM D4956-05
Title:
Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM E1855-05
Title:
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM F1562-95(2005)
Title:
Standard Guide for Use-Oriented Foreign Language Instruction
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM E1855-05e1
Title:
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM D6101-97(2005)
Title:
Standard Test Method for Equivalent Black Area (EBA) of Dirt in Pulp, Paper and Paperboard by Image Analysis (Withdrawn 2010)
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM E128-99(2005)
Title:
Standard Test Method for Maximum Pore Diameter and Permeability of Rigid Porous Filters for Laboratory Use
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM D3004-02
Title:
Standard Specification for Extruded Crosslinked and Thermoplastic Semi-Conducting, Conductor and Insulation Shielding Materials
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM B896-99(2005)
Title:
Standard Test Methods for Evaluating Connectability Characteristics of Electrical Conductor Materials
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM F1812-97a
Title:
Standard Test Method for Determining the Effectiveness of Membrane Switch ESD Shielding
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM C863-00(2005)
Title:
Standard Test Method for Evaluating Oxidation Resistance of Silicon Carbide Refractories at Elevated Temperatures
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM D6432-99(2005)
Title:
Standard Guide for Using the Surface Ground Penetrating Radar Method for Subsurface Investigation
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM F18-64(2006)
Title:
Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM E2444-05e1
Title:
Terminology Relating to Measurements Taken on Thin, Reflecting Films
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM E1570-00(2005)e1
Title:
Standard Practice for Computed Tomographic (CT) Examination
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM E1657-98(2006)
Title:
Standard Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F1221-89(2006)
Title:
Standard Guide for Interagency Information Exchange
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM B888-06
Title:
Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM C423-02ae1
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM D6095-06
Title:
Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F1364-03e1
Title:
Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM D4496-04e1
Title:
Standard Test Method for D-C Resistance or Conductance of Moderately Conductive Materials (Withdrawn 2013)
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM F875-94(2003)e1
Title:
Standard Test Method for Evaluation of Large Area Density and Background on Office Copiers
Organization: ASTM International
Year: 1994
Status: Inactive
ASTM F1423-97(2002)e1
Title:
Standard Practice for Determination of the Quality of Monochrome Images Produced from Non-Impact Personal Computer Printers
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM E1574-98(2006)
Title:
Standard Test Method for Measurement of Sound in Residential Spaces
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F1791-00(2006)
Title:
Standard Specification for Filters Used in Air or Nitrogen Systems
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM C159-06
Title:
Standard Specification for Vitrified Clay Filter Blocks
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM D5138-06
Title:
Standard Classification System for Liquid Crystal Polymers (LCP)
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM B615-79(2006)
Title:
Standard Practice for Measuring Electrical Contact Noise in Sliding Electrical Contacts
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F360-82(2006)
Title:
Standard Practice for Image Evaluation of Electrostatic Business Copies
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F505-87(2006)
Title:
Standard Practice for Comparative Evaluation of Imaging Properties of Liquid Electrostatic Toners
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F686-94(2006)
Title:
Standard Practice for Evaluation of Image Quality Produced by Carbonless Copy Paper with an Electric or Electronic Typewriter
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F1174-01(2006)
Title:
Standard Practice for Using a Personal Computer Printer as a Test Instrument
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F1320-01(2006)
Title:
Standard Test Method for Evaluating Thermal Paper Employing a Facsimile Thermal Printer as a Test Instrument
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F1192-00(2006)
Title:
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F2073-01(2006)
Title:
Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F1892-06
Title:
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM B187/B187M-06
Title:
Standard Specification for Copper, Bus Bar, Rod, and Shapes and General Purpose Rod, Bar, and Shapes
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM D5071-06
Title:
Standard Practice for Exposure of Photodegradable Plastics in a Xenon Arc Apparatus
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM E1438-06
Title:
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM D3849-95a(2000)
Title:
Standard Test Method for Carbon Black - Primary Aggregate Dimensions from Electron Microscope Image Analysis
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM D3862-80(2001)
Title:
Standard Test Method for Retention Characteristics of 0.2-µm Membrane Filters Used in Routine Filtration Procedures for the Evaluation of Microbiological Water Quality (Withdrawn 2010)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM B373-00(2006)
Title:
Standard Specification for Aluminum Foil for Capacitors (Withdrawn 2015)
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM C423-06
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM C423-07
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM E427-95(2006)
Title:
Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013)
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F2603-06
Title:
Standard Guide for Interpreting Images of Polymeric Tissue Scaffolds
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F2411-07
Title:
Standard Specification for Design and Performance of an Airborne Sense-and-Avoid System (Withdrawn 2014)
Organization: ASTM International
Year: 2006
Status: Inactive
ASTM F1598-95(2007)
Title:
Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method)
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM F2072-01(2007)
Title:
Standard Practice for Hosedown of a Membrane Switch
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM F640-07
Title:
Standard Test Methods for Determining Radiopacity for Medical Use
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM F1689-02
Title:
Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
Organization: ASTM International
Year: 2002
Status: Inactive
ASTM D4956-07
Title:
Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM E722-04e2
Title:
Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Organization: ASTM International
Year: 2005
Status: Inactive
ASTM D5933-96(2007)
Title:
Standard Specification for 2 5/8-in. and 4-in. Diameter Metal Shear Plates for Use in Wood Constructions
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM D4956-07e1
Title:
Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM E1919-07
Title:
Standard Guide for Worldwide Published Standards Relating to Particle and Spray Characterization
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM D4196-82(1998)
Title:
Standard Test Method for Confirming the Sterility of Membrane Filters
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM D5127-07
Title:
Standard Guide for Ultra-Pure Water Used in the Electronics and Semiconductor Industries
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM E2222-02(2007)
Title:
Standard Practice for Host Computer Communication with Spectrometers for Color Measurements (Withdrawn 2012)
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM B542-07
Title:
Standard Terminology Relating to Electrical Contacts and Their Use
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM F542-07
Title:
Standard Test Method for Exothermic Temperature of Encapsulating Compounds for Electronic and Microelectronic Encapsulation (Withdrawn 2013)
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM D1867-07
Title:
Standard Specification for Copper-Clad Thermosetting Laminates for Printed Wiring
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM B84-07
Title:
Standard Test Method for Temperature-Resistance Constants of Alloy Wires for Precision Resistors
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM B267-07
Title:
Standard Specification for Wire for Use In Wire-Wound Resistors
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM C423-07a
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM F1541-02(2007)
Title:
Standard Specification and Test Methods for External Skeletal Fixation Devices
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM E431-96(2007)
Title:
Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM E1854-07
Title:
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM F2113-01(2007)
Title:
Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM D4496-87(1998)e1
Title:
Standard Test Method for D-C Resistance or Conductance of Moderately Conductive Materials
Organization: ASTM International
Year: 1997
Status: Inactive
ASTM F1264-03(2007)
Title:
Standard Specification and Test Methods for Intramedullary Fixation Devices
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM F1578-07
Title:
Standard Test Method for Contact Closure Cycling of a Membrane Switch
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM F1596-07
Title:
Standard Test Method for Exposure of Membrane Switches to Temperature and Relative Humidity
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM F1762-07
Title:
Standard Practice for Exposing a Membrane Switch to Variation in Atmospheric Pressure
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM F1404-92(2007)
Title:
Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique (Withdrawn 2016)
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM F1423-97(2008)
Title:
Standard Practice for Determination of the Quality of Monochrome Images Produced from Non-Impact Personal Computer Printers
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM E1316-08
Title:
Standard Terminology for Nondestructive Examinations
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM B539-02(2008)
Title:
Standard Test Methods for Measuring Resistance of Electrical Connections (Static Contacts)
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM B868-96(2008)
Title:
Standard Practice for Contact Performance Classification of Electrical Connection Systems
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM C423-08
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM D4956-01a
Title:
Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2001
Status: Inactive
ASTM B888-08
Title:
Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM B49-08
Title:
Standard Specification for Copper Rod Drawing Stock for Electrical Purposes
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM B738-03(2008)
Title:
Standard Specification for Fine-Wire Bunch-Stranded and Rope-Lay Bunch-Stranded Copper Conductors for Use as Electrical Conductors
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM D3004-08
Title:
Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM D5071-99
Title:
Standard Practice for Exposure of Photodegradable Plastics in a Xenon Arc Apparatus
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F2218-02(2008)
Title:
Standard Guide for Hardware Implementation for Computerized Systems
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM D5109-99
Title:
Standard Test Methods for Copper-Clad Thermosetting Laminates for Printed Wiring Boards
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F615M-95(2008)
Title:
Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F1709-97(2008)
Title:
Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F1711-96(2008)
Title:
Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe Method
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM C1674-08
Title:
Standard Test Method for Flexural Strength of Advanced Ceramics with Engineered Porosity (Honeycomb Cellular Channels) at Ambient Temperatures
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F1262M-95(2008)
Title:
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F597-83(2008)
Title:
Standard Practice for Evaluation of One-Time Carbon Paper in Carbon-Interleaved Business Forms by Use of an Electric Typewriter (Withdrawn 2015)
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F1944-98(2008)
Title:
Standard Practice for Determining the Quality of the Text, Line- and Solid-Fill Output Produced by Ink Jet Printers (Withdrawn 2016)
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM D5138-99a
Title:
Standard Specification for Liquid Crystal Polymers
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM F1454-99(2008)
Title:
Standard Practice for Comparing Correctable Film Ribbons (Withdrawn 2015)
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM E1316-08a
Title:
Standard Terminology for Nondestructive Examinations
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F1844-97(2008)
Title:
Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F76-08
Title:
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F1845-08
Title:
Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F1709-97
Title:
Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM E2007-08
Title:
Standard Guide for Computed Radiography
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F2360-08
Title:
Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM C423-08a
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM E1127-08
Title:
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F792-08
Title:
Standard Practice for Evaluating the Imaging Performance of Security X-Ray Systems (Withdrawn 2017)
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F1264-03(2007)e1
Title:
Standard Specification and Test Methods for Intramedullary Fixation Devices
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM B49-08a
Title:
Standard Specification for Copper Rod Drawing Stock for Electrical Purposes
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM E125-63(2008)
Title:
Standard Reference Photographs for Magnetic Particle Indications on Ferrous Castings
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM E1245-03(2008)
Title:
Standard Practice for Determining the Inclusion or Second-Phase Constituent Content of Metals by Automatic Image Analysis
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM D5518-94e1
Title:
Standard Guide for Acquisition of File Aerial Photography and Imagery for Establishing Historic Site-Use and Surficial Conditions (Withdrawn 2003)
Organization: ASTM International
Year: 1998
Status: Inactive
ASTM F596-09
Title:
Standard Practice for Comparative Evaluation of the Imaging Properties of Dry Electrostatic Toners (Withdrawn 2015)
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F1423-09
Title:
Standard Practice for Determination of the Quality of Monochrome Images Produced from Non-Impact Personal Computer Printers (Withdrawn 2017)
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E2651-08
Title:
Standard Guide for Powder Particle Size Analysis
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM F875-94(2009)
Title:
Standard Test Method for Evaluation of Large Area Density and Background on Office Copiers
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E1316-09
Title:
Standard Terminology for Nondestructive Examinations
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F2721-08
Title:
Standard Guide for Pre-clinical <span class="bdit">in vivo</span> Evaluation in Critical Size Segmental Bone Defects
Organization: ASTM International
Year: 2008
Status: Inactive
ASTM D5714-95(2002)
Title:
Standard Specification for Content of Digital Geospatial Metadata (Withdrawn 2011)
Organization: ASTM International
Year: 1995
Status: Inactive
ASTM F25/F25M-09
Title:
Standard Test Method for Sizing and Counting Airborne Particulate Contamination in Cleanrooms and Other Dust-Controlled Areas
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM B878-97(2009)
Title:
Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM B885-09
Title:
Standard Test Method for Presence of Foreign Matter on Printed Wiring Board Contacts
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F2721-09
Title:
Standard Guide for Pre-clinical <span class="bdit">in vivo</span> Evaluation in Critical Size Segmental Bone Defects
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E566-09
Title:
Standard Practice for Electromagnetic (Eddy-Current) Sorting of Ferrous Metals
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E703-09
Title:
Standard Practice for Electromagnetic (Eddy-Current) Sorting of Nonferrous Metals
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F29-97(2009)
Title:
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F83-71(2009)
Title:
Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F85-76(2009)
Title:
Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F364-96(2009)
Title:
Standard Specification for Molybdenum Flattened Wire for Electron Tubes
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E1606-09
Title:
Standard Practice for Electromagnetic (Eddy-Current) Examination of Copper Redraw Rod for Electrical Purposes
Organization: ASTM International
Year: 2004
Status: Inactive
ASTM B682-01(2009)
Title:
Standard Specification for Standard Metric Sizes of Electrical Conductors
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E1161-09
Title:
Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E1316-09a
Title:
Standard Terminology for Nondestructive Examinations
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E1931-09
Title:
Standard Guide for X-Ray Compton Scatter Tomography
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F1842-09
Title:
Standard Test Method for Determining Ink or Coating Adhesion on Plastic Substrates for Membrane Switch Applications
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F1843-09
Title:
Standard Practice for Sample Preparation of Transparent Plastic Films used on Membrane Switch Overlays for Specular Gloss Measurements
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E722-09
Title:
Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F1812-09
Title:
Standard Test Method for Determining the Effectiveness of Membrane Switch ESD Shielding
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F1264-03(2007)e2
Title:
Standard Specification and Test Methods for Intramedullary Fixation Devices
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM F1541-02(2007)e1
Title:
Standard Specification and Test Methods for External Skeletal Fixation Devices
Organization: ASTM International
Year: 2007
Status: Inactive
ASTM D4956-09
Title:
Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E1647-09
Title:
Standard Practice for Determining Contrast Sensitivity in Radioscopy
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F875-09
Title:
Standard Test Method for Evaluation of Large Area Density and Background on Office Copiers (Withdrawn 2017)
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM C423-09
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E722-09e1
Title:
Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM C423-09a
Title:
Standard Test Method for Sound Absorption and Sound Absorption Coefficients by the Reverberation Room Method
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F497-00(2009)
Title:
Standard Practice for Use of the Electric and Electronic Typewriter as a Test Instrument (Withdrawn 2015)
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F1443-93(2009)
Title:
Standard Practice for Using 0.008-in. (0.203-mm) Aperture Reflectometers as Test Instruments for Measuring Visual Image Quality of Business Copy Images (Withdrawn 2017)
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM B579-73(2009)
Title:
Standard Specification for Electrodeposited Coatings of Tin-Lead Alloy (Solder Plate)
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM B634-88(2009)
Title:
Standard Specification for Electrodeposited Coatings of Rhodium for Engineering Use
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM B679-98(2009)
Title:
Standard Specification for Electrodeposited Coatings of Palladium for Engineering Use
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM B888-09
Title:
Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM B49-09
Title:
Standard Specification for Copper Rod Drawing Stock for Electrical Purposes
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E1919-09
Title:
Standard Guide for Worldwide Published Standards Relating to Particle and Spray Characterization (Withdrawn 2014)
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM D4956-09e1
Title:
Standard Specification for Retroreflective Sheeting for Traffic Control
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E427-95(2000)
Title:
Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode)
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM E431-96(2002)
Title:
Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Organization: ASTM International
Year: 1996
Status: Inactive
ASTM F677-04(2009)
Title:
Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E1316-10
Title:
Standard Terminology for Nondestructive Examinations
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM D3380-10
Title:
Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM F1282-10
Title:
Standard Specification for Polyethylene/Aluminum/Polyethylene (PE-AL-PE) Composite Pressure Pipe
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1316-10a
Title:
Standard Terminology for Nondestructive Examinations
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F1364-03(2010)
Title:
Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM B888-10
Title:
Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E986-04(2010)
Title:
Standard Practice for Scanning Electron Microscope Beam Size Characterization
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F2247-03(2010)
Title:
Standard Test Method for Metal Doors Used in Blast Resistant Applications (Equivalent Static Load Method)
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E566-99
Title:
Standard Practice for Electromagnetic (Eddy-Current) Sorting of Ferrous Metals
Organization: ASTM International
Year: 1999
Status: Inactive
ASTM E1332-10
Title:
Standard Classification for Determination of Outdoor-Indoor Transmission Class
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1332-10a
Title:
Standard Classification for Rating Outdoor-Indoor Sound Attenuation
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F773M-10
Title:
Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F996-10
Title:
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Volta...
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F2201-10
Title:
Standard Consumer Safety Specification for Utility Lighters
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F1895-10
Title:
Practice for Submersion of a Membrane Switch
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F1896-10
Title:
Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F2357-10
Title:
Standard Test Method for Determining the Abrasion Resistance of Inks and Coatings on Membrane Switches Using the Norman Tool "RCA" Abrader (Withdrawn 2017)
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM D7145-05(2010)e1
Title:
Standard Guide for Measurement of Atmospheric Wind and Turbulence Profiles by Acoustic Means
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1663-03(2010)
Title:
Standard Classification for Serviceability of an Office Facility for Typical Office Information Technology
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E2736-10
Title:
Standard Guide for Digital Detector Array Radiology
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E2007-10
Title:
Standard Guide for Computed Radiography
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1316-10b
Title:
Standard Terminology for Nondestructive Examinations
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1362-10
Title:
Standard Test Method for Calibration of Non-Concentrator Photovoltaic Secondary Reference Cells
Organization: ASTM International
Year: 2009
Status: Inactive
ASTM E668-00
Title:
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
Organization: ASTM International
Year: 2000
Status: Inactive
ASTM E668-10
Title:
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E2446-05(2010)
Title:
Standard Practice for Classification of Computed Radiology Systems
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1316-10c
Title:
Standard Terminology for Nondestructive Examinations
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1686-10
Title:
Standard Guide for Applying Environmental Noise Measurement Methods and Criteria
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM B896-10
Title:
Standard Test Methods for Evaluating Connectability Characteristics of Electrical Conductor Materials
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E722-94(2002)
Title:
Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Organization: ASTM International
Year: 1994
Status: Inactive
ASTM E1855-10
Title:
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E2651-10
Title:
Standard Guide for Powder Particle Size Analysis
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F2451-05(2010)
Title:
Standard Guide for <i>in vivo</i> Assessment of Implantable Devices Intended to Repair or Regenerate Articular Cartilage (Withdrawn 2019)
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E977-05(2010)
Title:
Standard Practice for Thermoelectric Sorting of Electrically Conductive Materials
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1476-04(2010)
Title:
Standard Guide for Metals Identification, Grade Verification, and Sorting
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1933-99a(2010)
Title:
Standard Test Methods for Measuring and Compensating for Emissivity Using Infrared Imaging Radiometers
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM B49-10
Title:
Standard Specification for Copper Rod Drawing Stock for Electrical Purposes
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F375-89(2010)
Title:
Standard Specification for Integrated Circuit Lead Frame Material
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1303-95(2010)
Title:
Practice for Refractive Index Detectors Used in Liquid Chromatography
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM C863-00(2010)
Title:
Standard Test Method for Evaluating Oxidation Resistance of Silicon Carbide Refractories at Elevated Temperatures
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM B896-10e1
Title:
Standard Test Methods for Evaluating Connectability Characteristics of Electrical Conductor Materials
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F1895-10a
Title:
Practice for Submersion of a Membrane Switch
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F2895-10
Title:
Standard Practice for Digital Radiography of Cast Metallic Implants
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM E1250-10
Title:
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
Organization: ASTM International
Year: 2010
Status: Inactive
ASTM F980-10
Title:
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Organization: ASTM International
Year: 1996
Status: Inactive